Inorganic Analytical Chemistry PortalSubject Areas
Programs and Projects
Fundamental Chemical Metrology
The Analytical Chemistry Division serves as the Nation’s reference laboratory for chemical compositional measurements and standards to … more
Standard Solution SRMs Provide Traceability for Millions of Measurements
For decades, NIST has provided the SRM 3100 series single-element standard solutions. The certified values are traceable to the International … more
High-Precision Isotopic Reference Materials
Recent innovative advances in the design and manufacture of isotope ratio mass spectrometers (IRMS) have revolutionized the study of natural and … more
Measurements, Standards, and Reference Materials for Industrial Commodities
All industrial sectors rely on elemental analysis and physical properties testing to confirm product compliance with manufacturing specifications. … more
Rapid Isotopic Screening
We have exploited the built-in functionality of a secondary ion mass spectrometer to provide the capability to screen the enrichment levels of a … more
Novel Stationary Phase Materials in Separation Science Research
Research activities in separation science continue to focus on investigations of the fundamental physical and chemical processes that influence … more Instruments
3D Atom Probe Tomography
The LEAP 4000X is a three-dimensional atom probe microscope which provides nano-scale surface, bulk and interfacial materials analysis of … more
Electron Microprobe
The JEOL JXA-8600 is a conventional hairpin filament thermal emission electron microprobe that is more than 20 years old. It is capable of … more
Focused Ion Beam (Helios 650)
The Helios 650 NanoLab (HNL650) is a Focused Ion Beam Scanning Electron Microscope equipped … more
NDP
Neutron Depth Profiling (NDP) is a nondestructive analytical technique for measuring the concentration profile of certain light elements as a … more
Field Emission Electron Probe
The JEOL JXA 8500f is a thermal field emission electron microprobe capable of performing quantitative X-ray microanalysis and secondary and … more
Focused Ion Beam/Dual Beam
The Nova NanoLab 600 (NNL600) is a Focused Ion Beam Scanning Electron Microscope equipped … more |
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