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Inorganic Analytical Chemistry Portal

Programs and Projects
Fundamental Chemical Metrology

The Analytical Chemistry Division serves as the Nation’s reference laboratory for chemical compositional measurements and standards to … more

Standard Solution SRMs Provide Traceability for Millions of Measurements

For decades, NIST has provided the SRM 3100 series single-element standard solutions. The certified values are traceable to the International … more

High-Precision Isotopic Reference Materials

Recent innovative advances in the design and manufacture of isotope ratio mass spectrometers (IRMS) have revolutionized the study of natural and … more

Measurements, Standards, and Reference Materials for Industrial Commodities

All industrial sectors rely on elemental analysis and physical properties testing to confirm product compliance with manufacturing specifications. … more

Rapid Isotopic Screening

We have exploited the built-in functionality of a secondary ion mass spectrometer to provide the capability to screen the enrichment levels of a … more

Novel Stationary Phase Materials in Separation Science Research

Research activities in separation science continue to focus on investigations of the fundamental physical and chemical processes that influence … more

Instruments
3D Atom Probe Tomography

The LEAP 4000X is a three-dimensional atom probe microscope which provides nano-scale surface, bulk and interfacial materials analysis of … more

Electron Microprobe

The JEOL JXA-8600 is a conventional hairpin filament thermal emission electron microprobe that is more than 20 years old. It is capable of … more

Focused Ion Beam (Helios 650)

The Helios 650 NanoLab (HNL650) is a Focused Ion Beam Scanning Electron Microscope equipped … more

NDP

Neutron Depth Profiling (NDP) is a nondestructive analytical technique for measuring the concentration profile of certain light elements as a … more

Field Emission Electron Probe

The JEOL JXA 8500f is a thermal field emission electron microprobe capable of performing quantitative X-ray microanalysis and secondary and … more

Focused Ion Beam/Dual Beam

The Nova NanoLab 600 (NNL600) is a Focused Ion Beam Scanning Electron Microscope equipped … more

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