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Purpose:A one-half day symposium on the advances to the field in the last 20 years that would have been of great interest to our colleague and friend Chuck Fiori. Agenda:“20 Years After Chuck: Progress in Microbeam Analysis Along Fiori’s Trajectories” Speakers:1:00 PM Welcome and Opening Remarks: John A. Small (Chief, Surface and Microanalysis Science Division, National Institute of Standards and Technology) 1: 15 - 1:50 Dale E. Newbury (NIST) “Elemental Mapping with the Silicon Drift Detector EDS: Useful Maps in Seconds; the Impossible in 30 minutes” 1:55 – 2:30 Nicholas W. M. Ritchie (NIST) “How can we help the SEM-EDS community to make better measurements?” 2:35 – 3:10 Edward Vicenzi (Smithsonian Institution) “A Microscopy and Microanalytical Examination of Mid-19th Century Photographs” 3:15 – 3:50 Richard Leapman (National Institutes of Health) "Development of EELS microanalysis in the biomedical sciences" |
Details: Start Date: Friday, September 14, 2012
End Date: Friday, September 14, 2012
Location: AML Complex Conference Room
Audience: Industry, Government, Academia
Format: Symposium
Sponsor(s):Registration:There is no registration fee but registration will be limited to 80 participants. NIST is a secure facility and no walk up registrations will be possible. All attendees including NIST employees must send an e-mail to abigail.lindstrom@nist.gov and indicate if a US citizen. Non-US citizens will be asked for additional information to process their registration. Registration Contact:Symposium Organizers
Dale Newbury, dale.newbury@nist.gov, 301-975-3921
Scott Wight, scott.wight@nist.gov, 301-975-3949
Abby Lindstrom, abigail.lindstrom@nist.gov, 301-975-5172 |