Instruments

Diffraction User Center Instruments

High-Temperature X-ray Diffractometer
High-Temperature Neutron Powder Diffractometer
Synchrotron Powder Diffractometer (Room Temp & High Temp)
Room-Temperature X-ray Diffractometers
Philips X'Pert Pro MPD X-Ray Diffractometer with Anton PAAR XRK-900 High Temperature Stage
Low Temperature X-ray Diffractometer

Materials Analysis User Center Instruments

Transmission Electron Microscopy

Hitachi HF-2000
Aberration Corrected Electron MicrosopeACEM, based on JEOL 2200FEF-AC

Dedicated Scanning Transmission Electron Microscope

Hitachi HD-2000 STEM

Scanning Electron Microscopes

Hitachi S-4700 & S-800

Scanning Auger Microprobe

PHI 680 Scanning Auger Microprobe

Electron Probe Analysis

JEOL 8200 Electron Superprobe

Focused Ion Beam Micromill

Hitachi FB-2000 FIB

Mechanical Characterization & Analysis User Center Instruments

High-Temperature Tensile Test Facility
Tensile Creep/Stress Rupture and Stress Relaxation Facility
Ceramic Flexure Test Facility
Electromechanical Test Facility
Electromechanical Test Facilities with Environmental Testing
Test Facility for Composites and their Constituents
Mechanical Properties Microprobe
Life-Prediction Analysis (FEA + ERICA / CERAMIC + CARES)
Resonant Ultrasound Spectroscopy (RUS) Facility

Residual Stress User Center Instruments

X-Ray Diffraction Facilities Overview

4-Axis Goniometer/18-kW Rotating Anode X-ray Source
4-Axis Goniometer/2-kW X-ray Tube
X14A Synchrotron 6-Axis Goniometer
Large Specimen X-ray Residual Stress Mapping Facility

Philips X'Pert Pro MPD X-Ray Diffractometer with Anton PAAR XRK-900 High Temperature Stage

Second Generation Neutron Diffraction Residual Stress Mapping Facility (NRSF2)

Thermography and Thermophysical Properties User Center Instruments

Thermal Analysis Instruments:

Simultaneous Thermal Analysis/Mass Spectrometer (DTA/TG/MS to 1500°C)
Concurrent Thermal Analysis (TG/DTA to 1700°C)
Differential Scanning Calorimeter (DSC to 1500°C)
Dual Push Rod Dilatometer (CTE to 1600°C)
Vertical Dilatometer (CTE to 2400°C and bi-layer CTE to 1600°C)
Auto Pycnometer (density at RT)

Thermal Transport Instruments:

High-Temperature Laser Flash Thermal Diffusivity System(LFTD to 2500°C)
Room-Temperature Xenon Flash Thermal Diffusivity Unit
Infrared Camera
3-Omega Thermal Conductivity System
Hot Disk Thermal Constants Analyzer

Tribology Research User Center Instruments

Instrumented and Non-Instrumented Machine Tools

E. O. Lee Creep-Feed Grinder
Weldon Cylindrical Grinder
Chevalier 818 CNC Surface Grinder
Sabre CNC Vertical Milling Machine
Benchman VMC4000 Vertical Machining Center
ProLight 3000 Turning Center
Precitech Optimum 2800 Diamond Turning and Grinding Machine

Dimensional Metrology and Imaging Systems

EMD Legend Coordinate Measuring Machine
Mahr Formtester
Nikon Optical Comparator
Rodenstock RM600 Laser Surface Mapping System
Taylor Hobson Talysurf 120 Stylus Profiling Instrument
Easy-Scan Atomic Force Microscope
KSI Scanning Acoustic Microscope
Optical Microscopy and Image Analysis System (Macro to 1000X)

Hardness, Scratch and Abrasion Testing

Buehler Microindentation Hardness Tester (Knoop and Vickers)
Revetest Instrumented Scratch and Adhesion Tester
Teledyne-Taber Portable Scratch Tester
Durometer Hardness Tester
Hysitron Triboindenter (MCAUC)
Bud Labs Continuous Loop Abrasion Tester
Chand Grindability Tester

Sliding Friction and Wear Testing

Room Temperature, Controlled Atmosphere Pin-on-Disk Apparatus
AMTI High-Temperature, Controlled Atmosphere Pin-on-Disk Apparatus
Low-Load Reciprocating Friction and Wear Tester
Plint TE-77 High-Load Reciprocating Friction and Wear Tester
Plint TE-53 Block-on-Ring and Rolling Contact Tester
High-Temperature Oscillating Scuffing Tester
Sub-Scale Brake Materials Testing System (SSBT)

Other Characterization Tools

Petrolab Minivis II Viscosimeter
Repetitive Impact Tester