Analytical Chemistry and Microscopy Laboratory
More Information
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Staff |
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Analysis |
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Elemental Analysis |
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Liquid-Chromatography
Mass-Spectrometry |
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Gas-Chromatography Mass-Spectrometry |
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Nuclear Magnetic Resonance
Spectroscopy |
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Sugar Analysis |
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Infrared
Spectroscopy |
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Scanning
Electron Microscopy |
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Microscopy |
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Other
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Why
consult with us
before designing your experiment?
We may be able to streamline your experience. Ask us
how... |
James
F. Beecher
Group Leader
Phone: (608) 231-9475
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Scanning Electron Microscopy
Scanning electron microscopy (SEM) is one of the most
frequently used microscopy tools. It allows study of both morphology and composition
of biological and physical materials.
High resolution images of morphology
(topography) are obtained by scanning an electron beam across a specimen.
Part of the versatility of this microscope is the ability to create images
over a wide range of magnification with large depth of field. Elemental
composition information can be obtained by monitoring the x-rays produced
by electron-specimen interaction.
The Zeiss EVO40 scanning electron microscope
features operation in a variable pressure mode. This supports study of specimens
at a pressure of up to 750 Pascal (~ 5.7 mm Hg ); such specimens do not
need conductive coatings and may be moist.
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