Events :: February 27, 2007
Technology and Innovation Subcommittee Chairman Rep. David Wu (D-OR) and Investigations and Oversight Subcommittee Vice-Chair Rep. Darlene Hooley (D-OR) hosted a demonstration of the world’s first table-top scanning electron microscope for science education on Wednesday, February 28th in Washington, D.C. This cutting edge technology will make nanotechnology education widely available at the college undergraduate level, and eventually at the high school level, helping the
“Only large research universities currently have the technology to view things at the nano-scale,” said Hooley. “With the invention of these smaller, less-expensive microscopes that work at the nano-level, we can spur college and high school students to learn about nanotechnology and help them remain competitive in the global market.” The FEI Company partnered with
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