Spin Electronics

Goals

The Spin Electronics Project focuses on developing measurements to better understand the interactions between the electron spin in current-carrying electrons and the magnetization of ferromagnetic films. These measurements will allow the investigation of magnetization dynamics at nanometer lengths scales characterized by precession angles that are orders of magnitude larger than previously accessible. They will facilitate the development and continued scaling of spintronic devices. The techniques developed as part of this program will support industrial roadmaps that have targeted magnetic disk drives with terabit-per-square-inch densities and magnetic random-access memory (MRAM) at the 65 nanometer node by the end of the decade. In addition, these measurements will help industry develop smaller and cheaper nanoscale magnetic microwave devices that may replace much larger and expensive on-chip microwave circuitry.

Customer Needs

Until recently, the only means known to control the magnetization state of ferromagnetic structures was through the use of applied magnetic fields. However, within the last several years it has been demonstrated that this can also be accomplished through the transfer of the electron spin angular momentum from current-carrying electrons to the magnetization of magnetic films, generally referred to as the spin-momentum-transfer (SMT) effect. Spin transfer represents a fundamentally new way to control and manipulate the magnetic states of devices, one that emerges only at the nanoscale. It will allow investigation of magnetization dynamics and spin-waves on length scales smaller than previously possible. It creates the ability to switch nanopatterned magnetic storage devices at speeds not previously accessible. It presents opportunities for the development of spin-switched MRAM and active microwave devices operating above frequencies of 100 gigahertz.

Graph of Time-domain data

Time-domain data showing the relative variation of
the oscillator phase over the locking range for several
values of DC bias current.

At present, the SMT effect is too poorly understood to effectively exploit or diminish its effects in practical devices, and little is accurately known about the dynamics induced by the effect. We will develop metrology to investigate and understand how spin-based effects can be avoided or exploited in magnetic nanostructures in order to assist the magnetic data storage industry and to facilitate the development of nanoscale microwave devices operating at high frequencies. These measurements will help industry develop future generation spintronic devices and facilitate the continued scaling of magnetic data storage into the deep nanometer range.

Technical Strategy

We are performing measurements on magnetic nanostructures in order to investigate magnetization dynamics at nanometer length scales and subnanosecond time scales. The high-speed dynamics and switching events are induced through the spin-transfer effect, which utilizes the transfer of the electron spin angular momentum in nanometric magnetic heterostructures to induce magnetic excitations at length scales down to 10 nanometers and at frequencies up to 100 gigahertz. We are measuring the high frequency properties of the spin transfer induced dynamics in patterned magnetic nanostructures as well as dynamics that are induced locally in continuous films.

We are trying to determine how spin-based effects can be avoided and exploited in magnetic nanostructures in order to assist the magnetic data storage industry and facilitate the development of nanoscale microwave devices. We will quantify the intrinsic device properties that determine the high frequency dynamics of spin-transfer nanoscale oscillators — such as oscillation frequency, linewidth, and power, which currently only qualitatively agree with theory — and develop measurements to relate the stochastic (statistical) switching characteristics of spin-switched MRAM to the component materials properties. For example, we are presently developing techniques to measure the magnetic precessional damping parameter in single, active devices with dimensions below 100 nanometers.

Accomplishments

Micromagnetic simulation

Micromagnetic simulations showing the spin-wave interaction between two local spin transfer oscillators. Each device emits spin-waves towards the other, causing the devices to synchronize.

Electron micrograph of two nanocontacts

Electron micrograph of two nanocontacts (dark circles in light rectangles) with FIB cut between them. Scale bar is 200 nm. Inset: Micromagnetic simulation showing spin-waves emitted by two contacts, and reflections from FIB cut.

Award

U.S. Department of Commerce Silver Medal (Bill Rippard, Stephen Russek, and Tom Silva) and EEEL Distinguished Associate Award (Matt Pufall and Shehzaad Kaka) for the discovery of mutual phase-locking, external frequency-locking, and frequency modulation of spin-transfer nano-oscillators, 2006.



Technical Contacts:
Bill Rippard

Staff-Years (FY 2006):
1.0 professional
2.0 research associates


Previous Reports:
2005

Magnetics Publications

NIST
Electromagnetics Division
325 Broadway
Boulder, CO 80305-3328
Phone 303-497-3131
Fax 303-497-3122

May 8, 2007

Back to Home Page