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NIST Standard Reference Database 64NIST Electron Elastic-Scattering Cross-Section Database: Version 3.1Version 3.0 of this database provides values of differential elastic-scattering cross sections, total elastic-scattering cross sections, phase shifts, and transport cross sections for elements with atomic numbers from 1 to 96 and for electron energies between 50 eV and 300 keV (in steps of 1 eV). The cross section in the database were provided by Prof. F. Salvat using relativistic theory. The software, developed by Prof. A. Jablonski, has the following features:
Knowledge of elastic-scattering effects is important for the development of theoretical models for quantitative analysis by Auger-electron spectroscopy, x-ray photoelectron spectroscopy, electron microprobe analysis, and analytical electron microscopy. The software package is designed to facilitate simulations of electron transport for these and similar applications in which electron energies from 50 eV to 300 keV are utilized. Hardware Requirements: PC with Windows 95, 98, NT, 2000, ME or XP; CD-ROM drive; Hard disk space of at least 52 MB. Cost: No charge For
more information please contact: National Institute of Standards and Technology 100 Bureau Dr., Stop 2300 Gaithersburg, MD 20899-2310 (301) 975-2008 (VOICE) / (301) 926-0416 (FAX) / Contact Us (E-MAIL) Scientific Contact: CSTL - Surface and Microanalysis Science Division (837) National Institute of Standards and Technology 100 Bureau Drive, Stop 8370 Gaithersburg, MD 20899-8370 Phone: (301) 975-2534 FAX: (301) 216-1134 email: cedric.powell@nist.gov Keywords:
Auger electron spectroscopy; cross-section; elastic scattering; electron
scattering; electron spectroscopy; electron transport; x-ray photoelectron
spectroscopy; x-ray spectroscopy, electron-probe microanalysis,
analytical electron microscopy, and surface analysis. |
Create Date: 6/02
Last Update: Thursday, 15-Mar-07 13:06:07
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