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The
Sources, Detectors and Displays Group conducts research on the
characterization of lasers, detectors, displays, and related components.
Principally through calibrations services, the group provides
the optoelectronics industry with traceability to national standards.
Activities
of the group are currently carried out in three project areas:
Display Metrology,High Speed Measurements,
and Laser Radiometry. Members of the Display Metrology Project work closely with industry
to identify and develop appropriate metrology for displays. Displays
are used convey information from the mundane such as totals from
cash registers to the critical such as MRI images for medical
diagnostics. These diverse applications require different approaches
for evaluating a display's performance. The High-Speed Measurements Project focuses
on laser and detector temporal properties, such as detector and
receiver frequency response and laser and optical amplifier noise. The Laser Radiometry Project is concerned
with measuring laser, detector, and component properties
such as laser power, laser beam profile, detector spectral responsivity,
detector linearity and the attenuation of transmission components.
To
calibrate detectors and instruments used to measure the power
or energy produced by a laser, the Group has developed a family
of standards that allow the accurate comparison of absorbed optical
power to dissipated electrical power. Together, these standards
permit calibrations at power levels from nanowatts to hundreds
of kilowatts and energy levels from femtojoules to megajoules.
Wavelength ranges include the visible through the near infrared,
and selected wavelengths in the ultraviolet and mid infrared.
For more information, see the Calibration Services section of
this site. Instruments designed to receive power either in collimated
beams or through optical fibers can be accommodated.
Note:
Photometric measurements, including the realization of the candela,
and radiometric measurements of spatially and spectrally extended
sources, are performed in the NIST Optical Technology Division
in Gaithersburg, MD.
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Page updated: 07/11/2007 |
