Collaborators and Customers
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The collaborators and customers of the Bayesian metrology
project include
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DARPA
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- Collaborator: DARPA
A major goal of the DARPA sponsored project,
understanding Internet performance from the user
perspective, is to create statistical models
sophisticated enough to cover a broad range of real
network behavior, and yet simple and intuitive enough
to be easily employed by network researchers.
Statistical modeling of network traffic is directed at
linking model parameters and/or modeled function features
to attributes of the network. Network traffic attributes
to be evaluated include: load (number of active
clients), time of day, time of week, node type (including
role and characteristics) and protocol features such as
mix of traffic by protocol type. Single distributional
form, even "heavy-tailed" distribution appear inadequate
for fitting network data. Our goal is to generate
reasonably parsimonious models that captures the
important network traffic attribute/behavior and also
produce Bayesian as well as frequentist diagnostics of
changes in that behavior.
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Semiconductor Industry
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- Customer: International SEMATECH Member Companies and
other industries -
Material on design and analysis of experiments for
assessing product reliability using Bayesian methods is
included in the NIST/SEMATECH
Engineering Statistics Internet Handbook available
on the World-Wide Web. These methods often offer more
efficient experiment designs than other statistical
methods do, reducing testing time for product reliability
assessments and therefore cutting product costs.
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LADAR
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- Collaborator:
LADAR (Lasar Radar)
In this context, and in conjunction with the commercial
sector, NIST initiated the concept of a national,
artifact-based, LADAR calibration site, comprising both
indoor and outdoor facilities. As part of that concept,
tools for the proper statistical analysis of collected
calibration data need to be developed based on both
classical and Bayesian paradigms.
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NIST Labs
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- Customer: NIST Labs
- CSTL
- PL
- BFRL
- MEL
- MSEL
- ITL
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Date created: 8/28/2001
Last updated: 8/28/2001
Please email comments on this WWW page to
sedwww@nist.gov.
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