Semiconductor Electronics Division
The Semiconductor Electronics Division (SED) provides leadership in developing the semiconductor measurement infrastructure essential to improving U.S. economic competitiveness. It provides necessary measurements, physical standards, and supporting data and technology; associated generic technology; and fundamental research results to industry, government, and academia. The primary mission of the Division is to provide technical leadership to industry, government, and academia in research and development of the semiconductor measurement and software infrastructure needs essential to the silicon microelectronics industry, advanced semiconductor materials technologies, and advanced electronic devices based upon molecular or quantum structures. The Division's programs also respond to industry measurement needs related to MicroElectroMechanical Systems (MEMS), power electronics, and various sub-areas of nanotechnology including nanoelectronics, nanocharacterization, nanobiotechnology, and plastic electronics. The technical programs, their goals, technical strategies, activities, and accomplishments described here for each Division project clearly demonstrate the impact of the SED's leadership and effective service as it continues to respond to the needs of industry and to contribute to the scientific and engineering communities. Thank you for your interest in our Division! I welcome your comments and suggestions. David G. Seiler, Division Chief
 
Novel Temperature Calibration Improves NIST Microhotplate TechnologyResearchers at the National Institute of Standards and Technology (NIST) have developed a new calibration technique that will improve the reliability and stability of one of NIST's most …
Memory with a Twist: NIST Develops a Flexible Memristor
Electronic memory chips may soon gain the ability to bend and twist as a result of work by engineers at the National Institute of Standards and Technology (NIST). As reported in the July 2009 issue … 
NIST Engineers Discover Fundamental Flaw in Transistor Noise TheoryPacemakers, like the implanted one shown in this image, are among the low-power devices that could be affected by new NIST findings about transistor noise. The findings indicate unforeseen … 
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