[QCAV'2003] [Call for Papers] [Registration] [Location] [Agenda] [Committee] [Attractions]

Artificial vision relates to the application of computers, sensors, methods, and networks to view and interpret the world through the "eyes" of a machine. Research and development in artificial vision has made tremendous strides over the last decade with the availability of high-speed, low cost computer systems, high-density, high fidelity vision sensors, and advanced internetworking capabilities such as those provided by the world wide web. Many advances in manufacturing have required tremendous corresponding advances in metrology, inspection, and data interpretation for process characterization and control that rely on the fundamental methods and technologies of artificial vision.

The International Conference on Quality Control by Artificial Vision (QCAV) provides a forum for university, government laboratory, and industrial researchers to present and discuss innovative concepts and methods for improving the quality and efficiency of industrial processes through artificial vision. The presentations will include contributed papers and poster sessions as well as invited speakers. Papers are invited that describe novel theoretical, experimental, and applied work in image processing and computer vision for industrial quality control through improved metrology, inspection, and process characterization. Papers are solicited from, but not limited to, the following categories:

• Vision Sensor Development and Integration
• Optical, Electron, X-ray, Ultrasound and Other Imaging Modalities
• Non-destructive Testing and Metrology
• Image Processing, Transforms, Segmentation, and Pattern Recognition
• Image Data Management, Analysis, and Interpretation
• Process Automation, Characterization, and Control
• Remote Diagnostics

There are many industries that are benefiting from artificial vision today. Papers are particularly encouraged from, but not limited to, the following industries:

Prospective authors must submit an extended summary of approximately 2,000 words (not including references) in English. Summaries must be single column and formatted to fit 8.5 in. x 11 in. page size. Electronic submissions must in Adobe PDF format only and are strongly encouraged. Papers can be submitted via e-mail attachment to the Organizing Secretary at ferrellrk@ornl.gov.

If electronic submission is not used, authors must send three (3) complete copies to:

Regina Ferrell
Oak Ridge National Laboratory
Bethel Valley Road
P.O. Box 2008
Oak Ridge, TN 37831-6010

Summary submission deadline, October 1, 2002
Notification of acceptance, November 15, 2002
Final manuscript due date, February 1, 2003

Each submission should consist of:

Title page containing

1. title of paper
2. author listing with principal author first including first and last name, affiliation, mailing address, telephone, facsimile, and e-mail address
3. Preference for oral or poster presentation
4. keywords (up to 5 descriptive words)
5. summary text (approximately 2000 words)
6. brief biography of principal author (approximately 50 words)

Conditions of Acceptance:

Authors are expected to secure registration fees and travel and accommodation funding through their sponsoring organizations before submitting abstracts. Only original material should be submitted. Summaries should contain enough detail to clearly convey the approach and the results of the research. To ensure a high-quality conference, all summaries will be reviewed for technical merit and content. Papers must relate to technologies, methods, strategies, and results, and should not emphasize commercial products.

Publishing Policy:

Manuscript due dates must be strictly observed. The QCAV2003 conference proceedings will be published by SPIE and will be available on-site to all registrants. Late manuscripts may not be published. The objective of this policy is to better serve the conference participants and the community at large. Your cooperation will be appreciated.

Proceedings of SPIE:

This conference will result in full-manuscript, editor-reviewed volumes published in the Proceedings of SPIE. Papers published are indexed in leading scientific databases including INSPEC, Compendex Plus, Physics Abstracts, Chemical Abstracts, International Aerospace Abstracts, and Index to Scientific and Technical Proceedings.