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 "OD1BARNMICH" VAP Process

Instrument Categories: Derived Quantities and Models

Description: Barnard-Michalsky MFRSR-NIMFR optical depth

The MFR Optical Depth VAP uses a technique developed by Dr. Joseph Michalsky, et al, as described in the Journal of Geophysical Research, June 2001. This method uses Langley regression data as computed by the Langley VAP (documented elsewhere) to obtain suitable daily Io values. These daily Io values are then used to compute optical depths from MFRSR or NIMFR data. Optical depths are computed for each MFR sample available, for most of the MFR wavelengths. Several optional data sets are consulted for the TOMS optical depth, to compute atmospheric pressure, and so on.

This VAP determines the spectral calibration of the MFRSR and NIMFR instruments and then subsequently calculates Total Optical Depth, Aerosol Optical Depth (AOD), and Angstrom coefficients.

For more details, see http://science.arm.gov/vaps/xmfrxod.stm.

Value-Added Products (VAPs) Produced

Primary Measurements

The following measurements are those considered scientifically relevant. Refer to the datastream (netcdf) file headers for the list of all available measurements, including those recorded for diagnostic or quality assurance purposes.

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