| Bibliographic Citation | |
| Full Text |  0 K |
|---|---|
| Title | Magnetic-Field Sensitive Line Ratios in EUV and Soft X-ray Spectra |
| Creator/Author | Beiersdorfer, P ; Scofield, J ; Brown, G V ; Chen, H ; Tr?bert, E ; Lepson, J K |
| Publication Date | 2006 Apr 24 |
| OSTI Identifier | OSTI ID: 895713 |
| Report Number(s) | UCRL-PROC-220911 |
| DOE Contract Number | W-7405-ENG-48 |
| Other Number(s) | TRN: US200711%%279 |
| Resource Type | Conference |
| Resource Relation | Conference: Presented at: NASA Laboratory Astrophysics Workshop, Las Vegas, NV, United States, Feb 14 - Feb 16, 2006 |
| Research Org | Lawrence Livermore National Laboratory (LLNL), Livermore, CA |
| Sponsoring Org | USDOE |
| Subject | 99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE; 74 ATOMIC AND MOLECULAR PHYSICS; ASTROPHYSICS; MAGNETIC FIELDS; NASA; X-RAY SPECTRA; SOFT X RADIATION |
| Description/Abstract | We discovered a class of lines that are sensitive to the strength of the ambient magnetic field, and present a measurement of such a line in Ar IX near 49 {angstrom}. Calculations show that the magnitude of field strengths that can be measured ranges from a few hundred gauss to several tens of kilogauss depending on the particular ion emitting the line. |
| Country of Publication | United States |
| Language | English |
| Format | Medium: ED; Size: PDF-file: 6 pages; size: 0 Kbytes |
| System Entry Date | 2008 Feb 14 |
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Last Updated: 05/14/2009