Project Title:

Synthetic, Moire-Fringe Surface Metrology

03.05-8775A
911446
Synthetic, Moire-Fringe Surface Metrology
Bauer Associates, Inc.
177 Worcester Road, Suite 101
Wellesley
MA
02181
Paul
Glenn
617-235-8775
ARC
NAS2-13440
035

03.05-8775A
911446

Abstract:

Synthetic, Moire-Fringe Surface Metrology
A new surface contour measurement will be developed. Because of its remote, non-contacting
nature, it will be able to measure a wide variety of structural deformations, including
those induced by high Mach number airflows over aerodynamic surfaces. The approach
is an innovative variation on Moire fringe techniques. It replaces the physical,
periodic viewing mask with specific digital image processing algorithms, making the
approach easy to implement and extremely flexible. The result is accurate measurement
data on a regular rectangular grid, with meaningful horizontal resolution equal to
that of the viewing system. Sensitivities to deflections of several micro-inches
and absolute accuracies better than one hundred micro-inches appear to be achievable.
Objectives are to define a baseline system and to develop calibration algorithms
and a comprehensive performance prediction model. Phase II will provide a breadboard
instrument to characterize and demonstrate its capabilities. NASA applications include
flight research sensors and instrumentation, as well as generalized surface metrology.
Benefits include real-time, non-contacting, accurate measurement of surface shapes
and deflections.
Applications include in-process surface and deflection mapping of complex parts,
including aerodynamic surfaces. The instrument can also be used for pre-weld shape
and orientation inspection, mold inspection, part alignment in a robotic manufacturing
cell, and measurement of human back shape for scoliosis screening.
contour measurement, deflectometry, Moire, non-contact