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Award Abstract #0216492
Acquisition of a High-Resolution Scanning Transmission Electron Microscope for Interdisciplinary Nanoscience Research
| NSF Org: |
CHE
Division of Chemistry
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| Initial Amendment Date: |
July 31, 2002 |
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| Latest Amendment Date: |
July 31, 2002 |
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| Award Number: |
0216492 |
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| Award Instrument: |
Standard Grant |
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| Program Manager: |
Robert L. Kuczkowski
CHE Division of Chemistry
MPS Directorate for Mathematical & Physical Sciences
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| Start Date: |
August 1, 2002 |
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| Expires: |
July 31, 2005 (Estimated) |
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| Awarded Amount to Date: |
$800000 |
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| Investigator(s): |
Norbert Scherer nfschere@uchicago.edu (Principal Investigator)
Robert Josephs (Co-Principal Investigator)
Heinrich Jaeger (Co-Principal Investigator)
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| Sponsor: |
University of Chicago
5801 South Ellis Avenue
Chicago, IL 60637 773/702-8602
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| NSF Program(s): |
MAJOR RESEARCH INSTRUMENTATION
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| Field Application(s): |
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| Program Reference Code(s): |
BIOT, AMPP, 9184, 9161
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| Program Element Code(s): |
1189
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ABSTRACT
With support from the Major Research Instrumentation (MRI) Program, Norbert F. Scherer and colleagues at the University of Chicago will acquire a high-resolution scanning transmission electron microscope (S/TEM) for interdisciplinary nanoscience research. The STEM will be used to study systems in nano-physics, nano-chemistry, and nano-biology. Some of the applications include characterization of nanocrystals; diblock copolymer used for making nanoparticle array wires; phase separation and structure studies for electroactive diblock copolymers; hemoglobin fiber formation and sickle cell anemia; genome-scale genetic analysis and fabrication of nano-structured materials with novel properties; biomembranes; high resolution e-beam writing using photoresists; and new direct methods of pattern formation.
Much of the research at the forefront of structural and cell biology and nanoscience requires routine characterization of specimens by a combination of transmission electron microscopy (TEM) and scanning transmission electron microscopy (S/TEM). High-end TEM is unsurpassed in terms of image resolution and ease of interpretation. In addition, with new capabilities such as tomography, electron microscopy is entering a new era in which its application can visualize molecular structure with (near-) atomic resolution.
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