For high-resolution particle-size analysis over the range of 0.04 microns to 2 mm, we use a commercially built apparatus that works on the basis of optical scattering. Light passing through a suspension of the material in question is diffracted at greater angles by small particles than by large particles. Related supporting operations include sample splitting with a 16-slot spinning riffler, sieving, and comparison measurements, when needed, by sedimentation techniques.
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