Optics Fabrication & Metrology Group

The Optics Fabrication & Metrology Group (OFM) is part of the X-ray Science Division (XSD) at the Advanced Photon Source, Argonne National Laboratory (Illinois, USA).

Our mission is:

1. to operate and develop instruments to fabricate and characterize x-ray optical elements, such as single crystal-monochromators, mirrors, multilayers, and other special substrates;
2. to carry out joint programs with the user community on the development of new optics for special beamline applications.

The mission is carried out in a collaboration with scientists and engineers and users at the APS, and others in industry, academia, government, and other synchrotron sources in the world.

	R&D 100 Award Winners				OFM Special Presentations				Laboratory Highlights
	Three APS employees win R&D 100 Award Three APS employees have won an R&D Magazine award for developing new multi-layer lens wafers for x-ray lenses that will help focus x-ray beams to the nanometer scale.				Al Macrander will be presenting an invited talk at Cornell/CHESS on 10/07/05. XianRong Huang will be presenting in conference room A1100 at 11:00 on 11/08/05. The presentation title is: Characterization of wide bandgap semiconductors using synchrotron topography and diffraction.				APS/XFD Automated Etching System

Report website problems to: Linda Shoudis at ljs@aps.anl.gov

Last updated on: March 30, 2006