Description of Invention:
The invention uses an oblique angle reflectance spectroscopy method to non-invasively quantify the thickness of the oral epithelium as a means for quantifying inflammation at sites in the oral cavity. In this technique, a toothbrush-sized probe is used to direct photon sources at two or more oblique angles and measure the scattered spectra to determine the thickness of the epithelial layer. Analysis of the spectra provides the location of the stroma/epithelium interface. The invention has applications in the assessment of drugs used in the treatment of Leukoplakia, which is characterized by a thickening of the oral epithelium as the underlying stroma remains unchanged. The invention provides a non-invasive technique for determining the efficacy of drugs used to treat the lesion, and promises to replace the need for uncomfortable punch biopsies.
Inventors:
Amir H. Gandjbakhche (NICHD) David W. Hattery (NICHD) James L. Mulshine (NCI) Paul D. Smith (ORS) Ernie Hawk (NCI) Victor Chernomordik (NICHD)
Patent Status:
DHHS Reference No. E-309-2000/0 --
U.S. Provisional Application No. 60/238,600 filed 06 Oct 2000
U.S. Patent Application No. 09/972,700 filed 05 Oct 2001
U.S. Patent Application No. 11/105,180 filed 13 Apr 2005
U.S. Patent Application No. 11/168,286 filed 27 Jun 2005 Licensing Status:
Limited fields of use available for non-exclusive licensing
For Additional Information Please Contact: Michael Shmilovich J.D.
NIH Office of Technology Transfer
6011 Executive Blvd, Suite 325
Rockville, MD 20852-3804
Phone: (301) 435-5019
Email: shmilovm@mail.nih.gov
Fax: (301) 402-0220
