Project Summary

Proposal Number: 970192
Project Title: New methods to Evaluate the Quality of GaN Materials using UV Radiation
Small Business Concern:: EMCORE Corporation
394 Elizabeth Ave
Somerset, NJ 08873
Research Institution:: Dept. of Physics
Rutgers University
Piscataway, NJ 08855-0849
Principal Investigator/Project Manager:: Ian Ferguson
Technical Abstract:: In solid state devices, the detective response to ultraviolet radiation is very sensitive to surface defects and other measures of material quality. This statement is especially true for low light levels at vacuum UV wavelengths. We propose to exploit this basic principle to develop new, cost-effective methods to test the quality of III-Nitrides and provide diagnostic feedback to manufacturers of these materials. We are in a uniquely well suited position to develop these methods as we played a key role in the creation of specialized vacuum chambers designed to evaluate detectors. These chambers represent a significant development effort undertaken by NASA's Space Telescope Imaging Spectrograph (STIS) Flight Program. While being state of the art, these chambers can be replicated at reasonable costs. The proposed program will first develop UV test procedures specifically to evaluate material quality of GaN and in subsequent years transfer this knowledge-based technology to NASA investigators developing these types of materials. Our goal is to improve material quality of III-Nitrides, improve the UV performance of detectors made from GaN, and eventually to assist other NASA-sponsored investigators acquire this UV test capability.
Potential Commercial Applications:: This technology is potentially very beneficial to manufacturers of GaN and AlGaN materials which are used in ultraviolet (UV) detectors. Development of UV photodetectors is driven by applications in miltary counter measures, aerospace, astropyhsics, solar physics, automotive, petroleum, and flame detection.