Licensable Technologies : Materials : Composites

Apparatus for Measurement of Critical Current in Superconductive Tapes (Cryogenic Linear Translator)

Abstract
Los Alamos National Laboratory has developed a technique and a tool for measuring the critical current (Ic) homogeneity of coated conductor superconducting tape. The technique reduces the probability of destroying the sections of the tape which have lower Ics during the measurement of sections with higher Ics. The tool permits the characterization of the homogeneity of high current (Ics>100 amperes in self-field in liquid nitrogen, T=~77K), coated conductors nondestructively, while yielding DC critical current data.

Application(s)
Los Alamos National Laboratory has developed a technique and a tool for measuring the critical current (Ic) homogeneity of coated conductor superconducting tape.

Advantages
Non-destructive characterization of conductor Ic homogeneity Capable of characterizing the sample at 0.1 cm and greater intervals Provides true DC critical current data Maximizes tape exposure to liquid nitrogen cooling

IP Status: Available both Exclusively and Non Exclusively

Reference Number: 107

S Number: DOE reference no.(s): 91,748

Patents & Applications:
United States National Patent Number 6452375 Issued on 09/17/2002

Posted: 09-17-2004

Contact
John Russell
Technology Transfer Division
Los Alamos National Laboratory
P.O. Box 1663, MailStop C334
(505) 665-3941
jrussell@lanl.gov