Licensable Technologies : Engineering : Manufacturing & Fabrication

Attenuated Total Internal Reflection (ATR) Infrared Microspectroscopic Imaging

Abstract

LANL scientists have developed a novel method of total internal reflection (ATR) infrared (IR) microspectroscopic imaging. The new method enables much larger imaging areas and faster collection times than existing commercial ATR systems. Data collected using the new method has a higher resolution, faster collection time, and larger image area. The measurement speed is increased by more than a factor of 10 over existing commercial systems that use internal reflectance elements. The attainable image size is more than 20 times larger than ATR methods using a focal plane array (FPA).

Advantages
Faster data collection
Larger image area
Eliminates relative motion errors associated with the point map method
Higher resolution imaging

IP Status: Available for Exclusive Licensing

Reference Number: 666

S Number: DOE reference no.(s): 104,964

Patents & Applications:
Application(s) Filed

Posted: 09-22-2005

Contact
John Mott
Technology Transfer Division
Los Alamos National Laboratory
P.O. Box 1663, MailStop C334
(505) 665-0883
jmott@lanl.gov