Licensable Technologies
: Engineering
: Environment/Waste Management
System and Method for Measuring Residual Stress
Abstract
The present invention is a method and system for determining the residual stress within an elastic object. In the method, an elastic object is cut along a path having a known configuration. The cut creates a portion of the object having a new free surface. The free surface then deforms to a contour which is different from the path. Next, the contour is measured to determine how much deformation has occurred across the new free surface. Points defining the contour are collected in an empirical data set. The portion of the object is then modeled in a computer simulator. The points in the empirical data set are entered into the computer simulator. The computer simulator then calculates the residual stress along the path which caused the points within the object to move to the positions measured in the empirical data set. The calculated residual stress is then presented in a useful format to an analyst.
Application(s)
Engineering and Quality Control applications for the following industries:
*Aerospace
*Automotive
*Transportation
*Industrial products
*Construction & Building
*Primary metals
Advantages
This system and method determines the residual stress within an elastic object at a new free surface where the residual stress is being relieved. Other techniques may avoid measuring deformation at the new free surface because the drill bit, or cutting tool introduced residual stress into the material during the removal process. Calculations are simple and direct rather than inversion calculations involving complex theory. The method does not require an analyst to have special training or expertise to perform the measurements.
IP Status: Available for Exclusive or Non-Exclusive Licensing
Reference Number: 263
S Number: DOE reference no.(s): 94,763
Patents & Applications:
United States National Patent Number 6470756 Issued on 10/29/2002
Posted: 05-06-2005
Contact
John Mott
Technology Transfer Division
Los Alamos National Laboratory
P.O. Box 1663, MailStop C334
(505) 665-0883
jmott@lanl.gov
