Licensable Technologies : Physics & Chemistry : Catalysts

COMPACT MASS SPECTROMETER FOR PLASMA ANALYSIS

Abstract
A mass spectrometer and methods for mass spectrometry which are useful in characterizing a plasma. This mass spectrometer for determining type and quantity of ions present in a plasma is simple, compact, and inexpensive. It accomplishes mass analysis in a single step, rather than the usual two-step process comprised of ion extraction followed by mass filtering. Ions are captured by a measuring element placed in a plasma and accelerated by a known applied voltage. Captured ions are bent into near-circular orbits by a magnetic field such that they strike a collector, producing an electric current. Ion orbits vary with applied voltage and proton mass ratio of the ions, so that ion species may be identified. Current flow provides an indication of quantity of ions striking the collector.

IP Status: Available both Exclusively and Non Exclusively

Reference Number: 341

S Number: DOE reference no.(s): 82,698

Patents & Applications:
United States National Patent Number 5650618 Issued on 07/22/1997

Posted: 08-20-2004

Contact
John Mott
Technology Transfer Division
Los Alamos National Laboratory
P.O. Box 1663, MailStop C334
(505) 665-0883
jmott@lanl.gov