Licensable Technologies : Materials : Manufacturing & Fabrication

Method for Determining Current Densities Using External Magnetic Field Measurements

Abstract
A technique and apparatus in which a magnetic device is scanned in close proximity to a material carrying electrical current in order to use the acquired spatial map of magnetic field distribution to determine quality of the conductor and to locate flaws in the material which are detrimental to current flow. 

Application(s)
Quality control in the production of superconductors, semiconductors, and all materials where flaws detrimental to current flow must be monitored and located.

Advantages
Non-contact measurement.  Provides data in real time, essential in a quality control function.

IP Status: Available both Exclusively and Non Exclusively

Reference Number: 643

S Number: DOE reference no.(s): 104,919

Patents & Applications:
Application(s) Pending

Posted: 06-09-2005

Contact
John Mott
Technology Transfer Division
Los Alamos National Laboratory
P.O. Box 1663, MailStop C334
(505) 665-0883
jmott@lanl.gov