Licensable Technologies : Materials : Nanotechnology

Puncture Detecting Barrier Materials

Abstract
A method and apparatus for continuous real-time monitoring of the integrity of protective barrier materials, particularly protective barriers against toxic, radioactive and biologically hazardous materials has been developed. Conductivity, resistivity or capacitance between conductive layers in the multilayer protective materials is measured by using leads connected to electrically conductive layers in the protective barrier material. The measured conductivity, resistivity or capacitance significantly changes upon a physical breach of the protective barrier material.

IP Status: Available Exclusively

Reference Number: 250

S Number: DOE reference no.(s): 84,971

Patents & Applications:
United States National Patent Number 5734323 Issued on 03/31/1998

Posted: 10-06-2004

Contact
John Mott
Technology Transfer Division
Los Alamos National Laboratory
P.O. Box 1663, MailStop C334
(505) 665-0883
jmott@lanl.gov