NASA/JSC has a requirement for Scanning Electron Microscope Service Agreement Qty (1).
NASA/JSC intends to purchase the service agreement from FEI Company. The Scanning Electron Microscope (SEM) is a sophisticated high-vacuum electron-optical instrument. This instrument is essential in performing failure analyses in support of many Johnson Space Center offices and programs. The SEM has also become the primary means this organization has of performing chemical analyses of materials. Maintaining the SEM in proper working order is an essential element of this organization's responsibility. The complexity of the instrument is such that the only practical means of keeping the instrument in proper working order is through a service contract. Proper maintenance and rapid troubleshooting requires a familiarity with the characteristics of this instrument. Troubleshooting often requires comparing voltages and waveforms of a working instrument with a malfunctioning instrument or actual exchange of modules and components. Only FEI Company has the unique knowledge and capabilities in regard to this instrument and the responsibility for providing such servicing of this instrument.
The Government intends to acquire a commercial item using FAR Part 12.
Interested organizations may submit their capabilities and qualifications to perform the effort in writing to the identified point of contact not later than 4:30 p.m. local time on January 23, 2009. Such capabilities/qualifications will be evaluated solely for the purpose of determining whether or not to conduct this procurement on a competitive basis. A determination by the Government not to compete this proposed effort on a full and open competition basis, based upon responses to this notice, is solely within the discretion of the government.
Oral communications are not acceptable in response to this notice.
All responsible sources may submit an offer which shall be considered by the agency.
An Ombudsman has been appointed. See NASA Specific Note "B".
Any referenced notes may be viewed at the following URLs linked below.
