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Meeting Organizer: Jane Zhu, DOE/BES Program Manager
Meeting Chairs: Dr. Chris Hammel, The Ohio State University; Dr. Amanda Petford-Long, Argonne National Laboratory

The U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, Electron and Scanning Probe Microscopies Contractors Meeting will be held at the Airlie Conference Center in Warrenton, Virginia.  The meeting will begin on Sunday, October 26, 2008 at 3:00 PM with registration and will end on Wednesday, October 29, 2008 at 2:00 PM.

The purpose of the Program Meeting is to bring together all the researchers funded by BES in this important research area so as to identify BES programmatic goals, align the fundamental research efforts with those goals, and foster new ideas and collaborations among the participants. This meeting will also be useful to DOE in assessing the state of the program, charting future directions and identifying programmatic needs.  The confidential and collegial environment will also provide unique opportunities to develop new collaborations among PIs, and even to develop or elaborate new ideas.

Each principal investigator funded by BES is requested to submit one extended abstract in advance.  Larger national laboratory groups should submit one abstract per project (or subtask area). Guidelines are found under Abstract Guidelines. ABSTRACT DEADLINE: 5:00 PM Eastern Time, Friday, September 5, 2008.

A detailed Agenda of plenary sessions that include research presentations selected from the abstracts, invited talks, and poster sessions will be available at a later date.

The meeting organizers invite each principal investigator (or subtask lead) to prepare a poster with the same title as the abstract to be presented at the meeting.  The poster should fit on a 4 ft. x 8ft. board (landscape orientation). Mounting pins will be provided.

All attendees must register for the meeting by entering information on this website under Registration. REGISTRATION DEADLINE is 5:00 PM Eastern Time, Friday, September 5, 2008.

NOTE: Participation is by invitation only.

The abstracts from the 2006 program meeting on Surface and Interface Science at the Atomic Scale are available to view in PDF format (6 MB).  

 

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