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Class Numbers & Titles | Class Numbers Only | USPC Index | International | HELP |
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Class 714 | ERROR DETECTION/CORRECTION AND FAULT DETECTION/RECOVERY |
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100 | DATA PROCESSING SYSTEM ERROR OR FAULT HANDLING |
1 | Reliability and availability |
2 | Fault recovery |
3 | By masking or reconfiguration |
4 | Of network |
5 | Of memory or peripheral subsystem |
6 | Redundant stored data accessed (e.g., duplicated data, error correction coded data, or other parity-type data) |
8 | Isolating failed storage location (e.g., sector remapping) |
9 | Access processor affected (e.g., I/O processor, MMU, DMA processor) |
10 | Of processor |
11 | Concurrent, redundantly operating processors |
13 | Prepared backup processor (e.g., initializing cold backup) or updating backup processor (e.g., by checkpoint message) |
14 | Of power supply |
15 | State recovery (i.e., process or data file) |
16 | Forward recovery (e.g., redoing committed action) |
18 | Transmission data record (e.g., for retransmission) |
19 | Undo record |
20 | Plural recovery data sets containing set interrelation data (e.g., time values or log record numbers) |
21 | State validity check |
22 | With power supply status monitoring |
23 | Resetting processor |
24 | Safe shutdown |
25 | Fault locating (i.e., diagnosis or testing) |
26 | Artificial intelligence (e.g., diagnostic expert system) |
27 | Particular access structure |
28 | Substituted emulative component (e.g., emulator microprocessor) |
30 | Built-in hardware for diagnosing or testing within-system component (e.g., microprocessor test mode circuit, scan path) |
31 | Additional processor for in-system fault locating (e.g., distributed diagnosis program) |
32 | Particular stimulus creation |
33 | Derived from analysis (e.g., of a specification or by stimulation) |
34 | Halt, clock, or interrupt signal (e.g., freezing, hardware breakpoint, single-stepping) |
35 | Substituted or added instruction (e.g., code instrumenting, breakpoint instruction) |
36 | Test sequence at power-up or initialization |
37 | Analysis (e.g., of output, state, or design) |
38 | Of computer software |
39 | Monitor recognizes sequence of events (e.g., protocol or logic state analyzer) |
40 | Component dependent technique |
41 | For reliability enhancing component (e.g., testing backup spare, or fault injection) |
42 | Memory or storage device component fault |
43 | Bus, I/O channel, or network path component fault |
44 | Peripheral device component fault |
45 | Output recording (e.g., signature or trace) |
46 | Operator interface for diagnosing or testing |
47 | Performance monitoring for fault avoidance |
48 | Error detection or notification |
49 | State error (i.e., content of instruction, data, or message) |
50 | State out of sequence |
51 | Control flow state sequence monitored (e.g., watchdog processor for control-flow checking) |
52 | Error checking code |
53 | Address error |
54 | Storage content error |
55 | Timing error (e.g., watchdog timer time-out) |
57 | Error forwarding and presentation (e.g., operator console, error display) |
699 | PULSE OR DATA ERROR HANDLING |
700 | Skew detection correction |
701 | Data formatting to improve error detection correction capability |
703 | Testing of error-check system |
704 | Error count or rate |
705 | Pseudo-error rate |
706 | Up-down counter |
707 | Synchronization control |
708 | Shutdown or establishing system parameter (e.g., transmission rate) |
709 | Data pulse evaluation/bit decision |
710 | Replacement of memory spare location, portion, or segment |
712 | Transmission facility testing |
713 | For channel having repeater |
714 | By tone signal |
715 | Test pattern with comparison |
717 | Loop or ring configuration |
718 | Memory testing |
719 | Read-in with read-out and compare |
721 | Electrical parameter (e.g., threshold voltage) |
722 | Performing arithmetic function on memory contents |
723 | Error mapping or logging |
724 | Digital logic testing |
725 | Programmable logic array (PLA) testing |
726 | Scan path testing (e.g., level sensitive scan design (LSSD)) |
727 | Boundary scan |
728 | Random pattern generation (includes pseudorandom pattern) |
729 | Plural scan paths |
730 | Addressing |
731 | Clock or synchronization |
732 | Signature analysis |
733 | Built-in testing circuit (BILBO) |
734 | Structural (in-circuit test) |
735 | Device response compared to input pattern |
736 | Device response compared to expected fault-free response |
737 | Device response compared to fault dictionary/truth table |
738 | Including test pattern generator |
739 | Random pattern generation (includes pseudorandom pattern) |
740 | Having analog signal |
741 | Simulation |
742 | Testing specific device |
743 | Addressing |
744 | Clock or synchronization |
745 | Determination of marginal operation limits |
746 | Digital data error correction |
747 | Substitution of previous valid data |
748 | Request for retransmission |
749 | Retransmission if no ACK returned |
750 | Feedback to transmitter for comparison |
751 | Including forward error correction capability |
752 | Forward correction by block code |
753 | Double error correcting with single error correcting code |
754 | Error correction during refresh cycle |
755 | Double encoding codes (e.g., product, concatenated) |
757 | Parallel generation of check bits |
758 | Error correcting code with additional error detection code (e.g., cyclic redundancy character, parity) |
759 | Look-up table encoding or decoding |
760 | Threshold decoding (e.g., majority logic) |
761 | Random and burst error correction |
762 | Burst error correction |
763 | Memory access |
764 | Error correct and restore |
765 | Error pointer |
766 | Check bits stored in separate area of memory |
767 | Code word for plural n-bit (n>1) storage units (e.g., x4 DRAM's) |
768 | Error correction code for memory address |
769 | Dynamic data storage |
772 | Code word parallel access |
773 | Solid state memory |
774 | Adaptive error-correcting capability |
775 | Synchronization |
776 | For packet or frame multiplexed data |
777 | Hamming code |
778 | Nonbinary data (e.g., ternary) |
779 | Variable length data |
780 | Using symbol reliability information (e.g., soft decision) |
781 | Code based on generator polynomial |
786 | Forward error correction by tree code (e.g., convolutional) |
787 | Random and burst errors |
788 | Burst error |
789 | Synchronization |
790 | Puncturing |
791 | Sequential decoder (e.g., Fano or stack algorithm) |
792 | Trellis code |
793 | Syndrome decodable (e.g., self orthogonal) |
794 | Maximum likelihood |
795 | Viterbi decoding |
796 | Branch metric calculation |
797 | Majority decision/voter circuit |
798 | Error detection for synchronization control |
799 | Error/fault detection technique |
800 | Parity bit |
801 | Parity generator or checker circuit detail |
802 | Even and odd parity |
803 | Parity prediction |
804 | Plural dimension parity check |
805 | Storage accessing (e.g., address parity check) |
806 | Constant-ratio code (m/n) |
807 | Check character |
809 | Code constraint monitored |
811 | Forbidden combination or improper condition |
812 | Specified digital signal or pulse count |
813 | Two key-down detector |
814 | Data timing/clocking |
815 | Time delay/interval monitored |
816 | Two-rail logic |
817 | Noise level |
818 | Missing-bit/drop-out detection |
819 | Comparison of data |
E-SUBCLASSES | ||
The following subclasses beginning with the letter E are E-subclasses. Each E-subclass corresponds in scope to a classification in a foreign classification system, for example, the European Classification system (ECLA). The foreign classification equivalent to an E-subclass is identified in the subclass definition. In addition to US documents classified in E-subclasses by US examiners, documents are regularly classified in E-subclasses according to the classification practices of any foreign Offices identified in parentheses at the end of the title. For example, "(EPO)" at the end of a title indicates both European and US patent documents, as classified by the EPO, are regularly added to the subclass. E-subclasses may contain subject matter outside the scope of this class.Consult their definitions, or the documents themselves to clarify or interpret titles. |
E11.001 | ERROR DETECTION; ERROR CORRECTION; MONITORING (EPO) |
E11.002 | Error detection other than by redundancy in data representation, operation, or hardware, or by checking the order of processing (EPO) |
E11.003 | By time limit, i.e., time-out (EPO) |
E11.004 | By count or rate limit, e.g., word- or bit count limit, etc. (EPO) |
E11.005 | By other limits, e.g., analog values, etc. (EPO) |
E11.006 | By bit configuration check, e.g., of formats or tags, etc. (EPO) |
E11.007 | Error correction, recovery or fault tolerance using at least two different redundancy techniques and at least one technique not involving redundancy (EPO) |
E11.008 | Fault tolerant software (EPO) |
E11.009 | In regular structures, i.e., all of the systems nodes have the same number of connections per node (EPO) |
E11.01 | Interconnection networks, i.e., comprising interconnecting link and switching elements (EPO) |
E11.011 | Fault-tolerant routing (EPO) |
E11.012 | In rings and buses (EPO) |
E11.013 | In n-dimensional structures, e.g., arrays, trees, cubes, etc. (EPO) |
E11.014 | Neural networks (EPO) |
E11.015 | By degradation, i.e., a slow-down occurs but full processing capability is maintained, e.g., discarding a faulty element or unit, etc. (EPO) |
E11.016 | In systems, e.g., multiprocessors, etc. (EPO) |
E11.017 | Security measures, i.e., ensuring safe condition in the event of error, e.g., for controlling element (EPO) |
E11.018 | Protecting against parasitic influences, e.g., noise, temperatures, etc. (EPO) |
E11.019 | Identification, e.g., of a performed repair, of a defined circuit, etc. (EPO) |
E11.02 | Reliability or availability analysis (EPO) |
E11.021 | Responding to the occurrence of a fault, e.g., fault tolerance, etc. (EPO) |
E11.022 | Error or fault processing without redundancy, i.e., by taking additional measures to deal with the error/fault (EPO) |
E11.023 | Error or fault handling (EPO) |
E11.024 | Error or fault detection or monitoring (EPO) |
E11.025 | Error or fault reporting or logging (EPO) |
E11.026 | Error or fault localization (EPO) |
E11.027 | By collation, i.e., correlating different errors (EPO) |
E11.028 | By identifying the faulty software code (EPO) |
E11.029 | Error or fault analysis (EPO) |
E11.03 | Error detection or correction by redundancy in data representation, e.g., by using checking codes, etc. (EPO) |
E11.031 | Using codes with inherent redundancy, e.g., n-out-of-m codes (EPO) |
E11.032 | Adding special bits or symbols to the coded information, e.g., parity check, casting out 9's or 11's, etc. (EPO) |
E11.033 | Using arithmetic codes i.e., codes which are preserved during operation, e.g., modulo 9 or 11 check, etc. (EPO) |
E11.034 | In memories (EPO) |
E11.035 | In static stores (EPO) |
E11.036 | Integrated on a chip (EPO) |
E11.037 | In cache or content addressable memories (EPO) |
E11.038 | In sector programmable memories, e.g., flash disk, etc. (EPO) |
E11.039 | In multilevel memories (EPO) |
E11.04 | To protect a block of data words, e.g., CRC, checksum, etc. (EPO) |
E11.041 | To protect individual data words written into, or read out of, the addressable memory subsystem of data processing equipment (EPO) |
E11.042 | Codes or arrangements adapted for a specific type of error (EPO) |
E11.043 | Error in accessing a memory location, i.e., addressing error (EPO) |
E11.044 | Error in check bits (EPO) |
E11.045 | Identification of the type of error (EPO) |
E11.046 | Adjacent error, e.g., error in n-bit (n>1) wide storage units, i.e., package error, etc. (EPO) |
E11.047 | Simple parity (EPO) |
E11.048 | Unidirectional errors (EPO) |
E11.049 | Arrangements adapted for a specific error detection or correction feature (EPO) |
E11.053 | Using single parity bit (EPO) |
E11.054 | Error detection or correction of the data by redundancy in hardware (EPO) |
E11.055 | Error detection by comparing the output signals of redundant hardware (EPO) |
E11.056 | In static storage, e.g., matrix, registers, etc. (EPO) |
E11.057 | In coding, decoding circuits, e.g. parity circuits (EPO) |
E11.058 | In communications, e.g., transmission, interfaces, etc. (EPO) |
E11.059 | Control processors, e.g., for sensors, actuators, etc. (EPO) |
E11.06 | With exchange of data between units (EPO) |
E11.061 | With data processors, i.e., data processors compare their computations (EPO) |
E11.062 | In storage with relative movement between record carrier and transducer, e.g., tapes, disks, etc. (EPO) |
E11.063 | In systems, i.e. comprising a multiplicity of resources, e.g., cpu with its memory and I/O, etc. (EPO) |
E11.064 | In arithmetic, logic or counter circuits or a combination thereof, e.g., alu, adder, etc. (EPO) |
E11.065 | In I/O devices or adapters therefor (EPO) |
E11.067 | Timing and synchronization therein (EPO) |
E11.069 | Using passive fault-masking of the redundant circuits, e.g., by quadding or by majority decision circuits, etc. (EPO) |
E11.071 | Using active fault-masking, e.g., by switching out faulty elements or by switching in spare elements, etc. (EPO) |
E11.072 | In systems, e.g., multiprocessors, etc. (EPO) |
E11.078 | In interconnections, e.g., rings, etc. (EPO) |
E11.08 | Data exchange between units, e.g., for updating backup units, etc. (EPO) |
E11.081 | For control, e.g., actuators, etc. (EPO) |
E11.082 | In arithmetic units (EPO) |
E11.083 | Redundant power supplies (EPO) |
E11.084 | Masking faults in storage systems using spares and/or by reconfiguring (EPO) |
E11.085 | Removing defective units from operation (EPO) |
E11.087 | With address translations and modifications (EPO) |
E11.089 | Managing spare storage units (EPO) |
E11.091 | Via redundancy in hardware accessing the storage components (EPO) |
E11.092 | Using redundant I/O processors, storage control units or array controllers (EPO) |
E11.095 | Connection redundancy between storage system components (EPO) |
E11.098 | Using the replication of data, e.g., with two or more copies, etc. (EPO) |
E11.099 | Duplex memories, e.g., twin boot ROMs, etc. (EPO) |
E11.101 | Mirroring, i.e., the concept of maintaining data on two or more units in the same state at all times (EPO) |
E11.102 | Resynchronization of failed mirrors (EPO) |
E11.103 | Mirror management, e.g., pairing of units, etc. (EPO) |
E11.104 | Mirroring on the same storage unit (EPO) |
E11.105 | Mirroring on different storage units with a common controller (RAID 1) (EPO) |
E11.106 | Mirroring with multiple controllers (EPO) |
E11.109 | De-clustering of replicated data (EPO) |
E11.11 | Using more than two copies (EPO) |
E11.111 | In Logic Arrays, e.g., programmable or iterative logic arrays, etc. (EPO) |
E11.112 | Error detection or correction of the data by redundancy in operation (EPO) |
E11.113 | Saving, restoring, recovering or retrying (EPO) |
E11.114 | At machine instruction level (EPO) |
E11.117 | Of application data (EPO) |
E11.118 | Backing up, restoring or mirroring files or drives (EPO) |
E11.119 | Backing up, i.e., point-in-time backup (EPO) |
E11.127 | Mirroring (EPO) |
E11.128 | Distributed database systems; Replica control (EPO) |
E11.13 | Using logs or checkpoints (EPO) |
E11.131 | In transactions (EPO) |
E11.132 | At operating system level (EPO) |
E11.133 | Boot up procedures (EPO) |
E11.134 | Reconfiguring to eliminate the error (EPO) |
E11.135 | During software upgrading (EPO) |
E11.136 | At file system or disk access level (EPO) |
E11.137 | Restarting or rejuvenating (EPO) |
E11.138 | Resetting or repowering (EPO) |
E11.139 | Cleaning up resources (EPO) |
E11.14 | Suspending and resuming a running system (EPO) |
E11.141 | Transmit or communication errors (EPO) |
E11.142 | Error detection (EPO) |
E11.144 | Error avoidance, e.g., error spreading countermeasures, fault avoidance, etc. (EPO) |
E11.145 | Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g., start-up testing, etc. (EPO) |
E11.146 | Verification or detection of system hardware configuration (EPO) |
E11.147 | Logging of test results (EPO) |
E11.148 | Test methods (EPO) |
E11.149 | Power-On Test, e.g., POST, etc. (EPO) |
E11.151 | Background testing (EPO) |
E11.152 | Periodic testing (EPO) |
E11.153 | Test trigger logic (EPO) |
E11.154 | Marginal checking (EPO) |
E11.155 | Testing of logic operation, e.g., by logic analyzers, etc. (EPO) |
E11.156 | Using Fault Dictionaries (EPO) |
E11.157 | Using Expert Systems (EPO) |
E11.158 | Using Neural Networks (EPO) |
E11.159 | Functional testing (EPO) |
E11.16 | Reconfiguring circuits for testing, e.g., LSSD, partitioning, etc. (EPO) |
E11.161 | Test of buses, lines or interfaces, e.g., stuck-at or open line faults, etc. (EPO) |
E11.162 | Test or error correction or detection circuits (EPO) |
E11.163 | Test of input/output devices or peripheral units (EPO) |
E11.164 | Test of ALU (EPO) |
E11.165 | Test of interrupt circuits (EPO) |
E11.166 | Test of CPU or processors (EPO) |
E11.167 | By simulating additional hardware, e.g., fault simulation, (EPO) |
E11.169 | Built-in tests (EPO) |
E11.17 | Tester hardware, i.e., output processing circuits, etc. (EPO) |
E11.171 | Test interface between tester and unit under test (EPO) |
E11.172 | Using a storage for the test inputs, e.g., test-ROM, script files, etc. (EPO) |
E11.173 | Remote test (EPO) |
E11.174 | Using a dedicated service processor for test (EPO) |
E11.175 | With comparison between actual response and known fault-free response, e.g., signature analyzer, etc. (EPO) |
E11.176 | In Multi-processor systems, e.g., one processor becoming the test master, etc. (EPO) |
E11.177 | Generation of test inputs, e.g., test vectors, patterns or sequences, etc. (EPO) |
E11.178 | By checking the correct order of processing (EPO) |
E11.179 | Monitoring (EPO) |
E11.18 | With visual or acoustical indication of the functioning of the machine (EPO) |
E11.181 | Visualization of programs or trace data (EPO) |
E11.182 | Display for diagnostics, e.g., diagnostic result display, self-test user interface, etc. (EPO) |
E11.184 | Display of status information (EPO) |
E11.189 | Recording or statistical evaluation of computer activity, e.g., of down time, of input/output operation, etc. (EPO) |
E11.19 | Of interconnections, e.g., interconnecting networks, etc. (EPO) |
E11.191 | Of parallel or distributed programming (EPO) |
E11.192 | Performance measurement (EPO) |
E11.193 | Workload generation, e.g., scripts, playback etc. (EPO) |
E11.195 | Time measurement, e.g., response time, etc. (EPO) |
E11.197 | Performance evaluation by modeling or statistical analysis (EPO) |
E11.198 | Performance evaluation by simulation (EPO) |
E11.2 | Performance evaluation by tracing or monitoring (EPO) |
E11.207 | Preventing errors by testing or debugging software (EPO) |
E11.208 | Software debugging (EPO) |
E11.209 | Compilers or other tools operating on the source text (EPO) |
E11.21 | Debuggers (EPO) |
E11.211 | Error checking code in the program under test (EPO) |
E11.212 | Tracing methods or tools (EPO) |
E11.213 | By using additional hardware (EPO) |
E11.217 | User interfaces for testing or debugging software (EPO) |
E11.218 | Methods or tools for writing reliable software and for evaluating software (EPO) |
FOREIGN ART COLLECTIONS | ||
FOR000 | CLASS-RELATED FOREIGN DOCUMENTS |
Any foreign patents or non-patent literature from subclasses that have been reclassified have been transferred directly to FOR Collections listed below. These Collections contain ONLY foreign patents or non-patent literature. The parenthetical references in the Collection titles refer to the abolished subclasses from which these Collections were derived. | ||
MEMORY TESTING (371/21.1) |
DIGITAL LOGIC TESTING (371/22.1) |
DIGITAL DATA ERROR CORRECTION (371/30) |
FOR100 | Scan path testing (LSSD) (371/22.3) |
FOR101 | Including test pattern generator (371/27) |
FOR102 | Block code (371/37.1) |
FOR104 | Convolutional code (371/43) |
FOR288 | ERROR/FAULT ANTICIPATION (371/4) |
DIAGNOSTIC TESTING (371/15.1) |
FOR293 | Programmable processor testing (371/16.1) |
FOR294 | Emulator device (371/16.2) |
FOR295 | Watchdog timer (e.g., time-out) (371/16.3) |
FOR296 | Processor within diverse (microwave, photocopier) (371/16.4) |
FOR297 | Error or fault, logging or tracking (371/16.5) |
FOR298 | Dedicated maintenance subsystem (371/18) |
FOR299 | Testing of external device by programmable digital computer (371/20) |
FOR300 | ERROR DETECTION FOR SYNCHRONIZATION CONTROL (371/47.1) |
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