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NIST Standard Reference Subscription Database 1NIST X-Ray Photoelectron Spectroscopy Database: Version 4.0Version 4.0 of the NIST X-ray Photoelectron Spectroscopy Database contains over 29,000 data records, an increase of 6,844 data records from Version 3.4. For the newly added records, considerable information is supplied about the specimen materials (e.g., specimen morphology and methods of specimen preparation, processing, and characterization), XPS measurement conditions (e.g., type of X-ray source and whether an X-ray monochromator was utilized), and XPS data analysis (e.g., background-subtraction method, peak-location method, and line widths). The new data records originated from an evaluation of over 5,000 scientific papers that were published generally between 1993 and 1996. Data are given for the positions of photoelectron lines, chemical shifts, doublet splittings, and surface and interface core-level shifts. In addition, data are provided for the kinetic energies of Auger lines measured in an XPS spectrum and for Auger parameters. Click to view the subscription License Agreement before ordering. Pricing Information: NIST X-ray Photoelectron Spectroscopy Database (SRD20) Version 4.0 Individual License - Individual License $500.00
Small Institution - Small Institution (2 to 500 users) $800.00 Medium
Institution - Medium Institution (501 to 2000 users) $1100.00
Large
Institution - Large Institution (2001+ users) $1500.00
For
more information on NIST
X-Ray Photoelectron
Spectroscopy Database: Version 4.0 contact: National Institute of Standards and Technology 100 Bureau Dr., Stop 2300 Gaithersburg, MD 20899-2310 (301) 975-2008 (VOICE) joan.sauerwein@nist.gov (E-Mail) (301) 926-0416 (FAX) Contact Us (E-MAIL) The scientific contact is:
Keywords:
photoelectron, spectroscopy, spectral lines, materials, chemistry, line
energy, chemical shifts, chemical splittings, Auger kinetic energies.
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Create Date: 6/02
Last Update: [an error occurred while processing this directive]
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