Lu named fellow of American Physical Society
ARGONNE, Ill. (Jan. 24, 2007) — Zheng-Tian Lu of Argonne National Laboratory
and the University of Chicago has been elected a fellow of the American
Physical Society. The honor recognizes his development of an ultra-sensitive
trace analysis technique and its applications to radiokrypton dating and fundamental
physics research.
Atom Trap Trace
Analysis is able to detect single atoms in a large sample.
The technology holds promise for advancing the state of the art in many fields,
from nuclear safeguards to Earth climate studies. The technique has been used
to determine, for the first time, the age and direction of movement of water
in one of the largest underground aquifer in the world. It has also been used
to measure the charge radii of short-lived nuclei.
In 2000, Lu won the U.S. Presidential
Early Career Award for Scientists and
Engineers and the DOE Office of Science Early Career Scientist and Engineer
Award.
Lu is a member of the American Physical Society and of the Overseas
Chinese Physics Association.
Argonne National Laboratory seeks solutions to pressing national problems in science and technology.
The nation's first national laboratory, Argonne conducts leading-edge basic
and applied scientific research in virtually every scientific discipline. Argonne
researchers work closely with researchers from hundreds of companies, universities,
and federal, state and municipal agencies to help them solve their specific
problems, advance America 's scientific leadership and prepare the nation for
a better future. With employees from more than 60 nations, Argonne is managed
by UChicago
Argonne, LLC for
the U.S.
Department of Energy's Office
of Science.
For more information, please
contact Eleanor Taylor (630/252-5510 or media@anl.gov)
at Argonne.
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