Los Alamos National Laboratory   LANL Site Map | LANL News | LANL Jobs | LANL Maps |LANL Research Library | LANL Phonebook | LANL search
LANL Library Catalog
What's New in the Catalog
Login to My Account
My e-Shelf
  Search/Browse  |  Advanced Search  |  Browse   Previous Searches  
Help 
 

Full View of Record

Back to Results List |  Add to My e-Shelf |  Save/Email
Choose format: Standard Full tag view
Title   LinkPhotomask and next-generation lithography mask technology XV : 16-18 April 2008, Yokohama, Japan /
Author   LinkHoriuchi, Toshiyuki. 
Physical Descr.   2 v. :  digital, PDF file.
Series   Link( Proceedings of SPIE--the International Society for Optical Engineering v. 7028.)
Note   Some earlier proceedings have title: Photomask and X-ray mask technology.
Bibliography   Includes bibliographical references.
Additional Form   Available online to subscribers via SPIE Digital Library at http://www.spiedl.org
Subject   LinkMasks (Electronics) -- Congresses.
  LinkIntegrated circuits -- Masks -- Congresses.
  LinkX-ray lithography -- Congresses.
  LinkMicrolithography -- Congresses.
  LinkOptoelectronic devices -- Design and construction -- Congresses.
Other Author   LinkPhotomask Japan.
  LinkBACUS (Technical group)
  LinkSociety of Photo-optical Instrumentation Engineers
  LinkSPIE Digital Library
Other Title   Photomask and next-generation lithography mask technology
Add.Title   LinkPhotomask and X-ray mask technology
ISBN   9780819472434
  0819472433
Format   Book
  Electronic Book
  Online resource
Record Number   001342703
 
ONLINE ACCESS:   http://link.spie.org/PSISDG/7028/1 

  Search/Browse  |  Advanced Search  |  Browse   Previous Searches  


Los Alamos National Laboratory

Operated by the Los Alamos National Security, LLC, for the U.S. Department of Energy's NNSA
© Copyright 2006–2007 LANSLLC All rights reserved | Disclaimer/Privacy
http://catalog.lanl.gov | Last Modified: 11/29/07 | Powered by Ex Libris Aleph500 v18.01
Send email to the Library | Library Privacy Policy