Microanalysis Laboratory

The Microanalysis Laboratory has several state-of-the-art research tools and staff with expertise in various microcharacterization techniques. Our mission is to:

• Provide services for the development of magnet technology
• Conduct both fundamental and applied research in materials development
• Promote education in the frontiers of materials science, and train interested researchers, including students to use the facilities and instrumentation

Technologically advanced materials exhibit unique properties because of their microstructures and microchemistry atomic to micro-scales. In order to improve their properties, it is necessary to develop a deeper understanding of the controlling microstructural parameters such as the grain size and morphology, topography, defects, crystallography and elemental composition of the materials. The lab features several instruments, listed below, for these advanced microanalyses. Information on how these instruments are being used is available on our scheduling page and by contacting Bob Goddard.

• Zeiss 1540 EsB Scanning Electron Microscope – Scheduling
• Zeiss 1540 XB Scanning Electron Microscope – Scheduling
• JEOL 2010 Transmission/Scanning Electron Microscope – Scheduling
• JEOL 6380 Scanning Electron Microscope – Scheduling
• Leica Optical Microscope
• Philips X’pert diffractrometry
• Sample Preparation Laboratory

Image Processing and Analysis Software

In addition to the above instruments, the Microanalysis Lab features software for image acquisition and analysis, and crystallography simulations.

IMIX (Integrated Microanalyzer for Images and X rays). This microanalysis software from Princeton-Gamma Tech features a collection of powerful tools for collecting, processing and analyzing images to extract all the information. Video collection from light microscopes can also be used to digitize images.

Desktop Microscopist. This software from Virtual Laboratories is an interactive software that performs a suite of useful tasks for the electron microscopist in material science. Main supported features: sterographic projections, electron diffraction (SAD, ring, Kikuchi, HOLZ), X-ray diffraction (Debye Sherrer, diffractometer, Laue), phase diagrams, lattice display.

For more information or assistance, please contact Ke Han (general information); Bob Goddard (SEM and Metallurgical Lab); or Yan Xin (TEM).