Jon Hiller

Scientific Associate

Materials Science Divsion; Bldg. 212
Argonne National Laboratory
9700 S. Cass Ave.
Argonne IL 60439

phone: 630-252-9558
fax: 630-252-4289
email: hiller@anl.gov

Scientific Associate
Electron Microscopy Center for Materials Research

I assist and train scientists and graduate students how to operate the Zeiss 1540XB Focused Ion Beam (FIB) system as well as the JEOL 4000 High Resolution TEM. My present focus is in developing new FIB techniques for nanoscale pattern generation and advanced site specific TEM preparation.

Scientific Interests:

• Refining and developing preparation techniques for TEM using Focused Ion Beams.
• In situ nanomanipulation
• Direct write lithography for MEMS prototyping
• TEM stage development

Technical Specialties:

• Proficient in TEM, SEM, FIB
• Device manipulation
• Sample preparation
• Nanomachining techniques

Interests and Hobbies:

• Fishing
• Hiking
• Woodworking
• Watching the Green Bay Packers beat the Chicago Bears ;)