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Inventec Pudong EMC Center

NVLAP Lab Code: 500018-0


Address and Contact Information:

699 Puxing Road, Min Hang District,
Shanghai 201114
CHINA
Contact: Mr. Kenny Liu
Phone: 86-21-64298888-66337
Fax: 86-21-24031112
E-Mail: liu.kennyhc@inventec.com
Send E-Mail to Laboratory: Inventec Pudong EMC Center

NVLAP Accreditation Information

Listed below is the scope of accreditation for this laboratory as of January 8, 2009. For additional information, contact NVLAP at (301) 975-4016.

Send E-Mail to NVLAP at: NVLAP@nist.gov


Electromagnetic Compatibility & Telecommunications

Accreditation Valid From: July 21, 2008 Through: June 30, 2009

  • Emissions Test Methods:

[12/CIS22c4] EN 55022 (1998) + A1(2000) + A2(2003)
Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement

[12/CIS22f] CNS 13438 (2006)
LImits and Methods of Measurement of Radio Interference Characteristics of Information Technology Equipment

[12/CIS22g] IEC/CISPR 22, Edition 5 (2005-04) and EN 55022 (2006)
Limits and Methods of Measurement of Radio Disturbance Characteristics of Information Technology Equipment

[12/CIS22i] IEC/CISPR 22, Edition 5.2 (2006-03)
Limits and Methods of Measurement of Radio Disturbance Characteristics of Information Technology Equipment

[12/EM02g]
IEC 61000-3-2, Edition 3.0 (2005-11), EN 61000-3-2 (2000), and AS/NZS 2279.1 (2000): Electromagnetic Compatibility (EMC) Part 3-2: Limits - Limits for Harmonic Current Emissions (Equipment Input Current <= 16A)

[12/EM02i] IEC 61000-3-2, Ed. 3.0 (2005-11)
Electromagnetic compatability (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current <=16 A per phase)

[12/EM02j] EN 61000-3-2 (2006)
Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current up to and including 16 A per phase)

[12/EM03b] IEC 61000-3-3, Edition 1.1(2002-03) & EN 61000-3-3, A1(2001)
EMC - Part 3-3: Limits - Limitations of voltage changes, voltage flucuations and flicker, in public low-voltage supply-systems, for equipment with rated current <=16 A per phase and not subject to conditional connections

[12/EM03i] IEC 61000-3-3 (2005), EN 61000-3-3 (1995) + A2 (2005)
EMC - Part 3-3: Limits - Limitations of voltage changes, voltage flucuations and flicker, in public low-voltage supply-systems, for equipment with rated current <=16 A per phase and not subject to conditional connections

[12/EM03j] AS/NZS 2279.3 (2001)
EMC - Part 3-3: Limits - Limitations of voltage changes, voltage flucuations and flicker, in public low-voltage supply-systems, for equipment with rated current <=16 A per phase and not subject to conditional connections

[12/FCC15b] ANSI C63.4 (2003) with FCC Method 47 CFR Part 15, Subpart B
Unintentional Radiators

[12/T51b] AS/NZS CISPR 22, 3rd Edition (2006)
Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement

[12/VCCIb] Agreement of VCCI V-3 (2006.04)
Agreement of Voluntary Control Council for Interference by Information Technology Equipment - Technical Requirements: V-3/2006.04

  • Immunity Test Methods:

[12/I01b] IEC 61000-4-2 (2001); EN 61000-4-2 (2001), A2 (2001)
Electrostatic Discharge Immunity Test

[12/I01c] EN 61000-4-2 +A1(1998) +A2(2001)
Electrostatic Discharge Immunity Test

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For questions concerning the National Voluntary Laboratory Accreditation Program, contact us:

National Voluntary Laboratory Accreditation Program, Standards Services Division, NIST, 100 Bureau Drive, Stop 2140, Gaithersburg, MD 20899-2140
Phone: (301) 975-4016, Fax: (301) 926-2884, Email: NVLAP@nist.gov

Date created: July 26, 2002
Last Updated: January 8, 2009

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