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Teradata Corporation EMC Lab

NVLAP Lab Code: 200383-0


Address and Contact Information:

17095 Via del Campo
San Diego, CA 92127-1711
Contact: Mr. John Flavin
Phone: 858-485-3874
Fax: 858-485-3788
E-Mail: john.flavin@teradata.com
Send E-Mail to Laboratory: Teradata Corporation EMC Lab

NVLAP Accreditation Information

Listed below is the scope of accreditation for this laboratory as of January 8, 2009. For additional information, contact NVLAP at (301) 975-4016.

Send E-Mail to NVLAP at: NVLAP@nist.gov


Electromagnetic Compatibility & Telecommunications

Accreditation Valid From: January 1, 2009 Through: December 31, 2009

  • Emissions Test Methods:

[12/CIS22] IEC/CISPR 22 (1997) & EN 55022 (1998) + A1(2000)
Limits and methods of measurement of radio disturbance characteristics of information technology equipment

[12/CIS22a] IEC/CISPR 22 (1993) and EN 55022 (1994)
Limits and methods of measurement of radio disturbance characteristics of information technology equipment, Amendment 1 (1995) and Amendment 2 (1996)

[12/CIS22b] CNS 13438 (1997)
Limits and Methods of Measurement of Radio Interference Characteristics of Information Technology Equipment

[12/CIS22c] IEC/CISPR 22, Fourth Edition (2003-04) & EN 55022 (1998)
Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement

[12/CIS22e] IEC/CISPR 22 (2002) and EN 55022 (1998)
Limits and Methods of Measurement of Radio Disturbance Characteristics of Information Technology Equipment

[12/CIS22f] CNS 13438 (2006)
LImits and Methods of Measurement of Radio Interference Characteristics of Information Technology Equipment

[12/EM01] EN 50081-1 (1992)
Electromagnetic compatibility - Generic emission standard - Part 1: Residential, commercial and light industry

[12/EM02a]
IEC 61000-3-2, Edition 2.1 (2001-10), EN 61000-3-2 (2000), and AS/NZS 2279.1 (2000): Electromagnetic compatibility (EMC) Part 3-2: Limits - Limits for harmonic current emissions (equipment input current <= 16 A)

[12/EM03] IEC 61000-3-3(1995); EN 61000-3-3(1995); AS/NZS 2279.3(1995)
EMC - Part 3: Limits - Section 3. Limitation of voltage fluctuations and flicker in low-voltage supply systems for equipment with rated current up to 16A

[12/FCC15b] ANSI C63.4 (2003) with FCC Method 47 CFR Part 15, Subpart B
Unintentional Radiators

[12/T51a] AS/NZS CISPR 22 (2004)
Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement

[12/VCCIc] Agreement of VCCI V-3 (2007.04)
Agreement of Voluntary Control Council for Interference by Information Technology Equipment - Technical Requirements: V-3/2007.04

[12/VCCId] Agreement of VCCI V-3 (2008.04)
Agreement of Voluntary Control Council for Interference by Information Technology Equipment - Technical Requirements: V-3/2008.04

  • Immunity Test Methods:

[12/CIS24a] EN 55024 and CISPR 24 (1997, modified)
Information technology equipment - Immunity characteristics - Limits and methods of measurements

[12/I01] IEC 61000-4-2, Ed. 1.2 (2001) + A1, A2; EN 61000-4-2
Electrostatic Discharge Immunity Test

[12/I01a] IEC 61000-4-2 (1995), A1(1998), A2(2000); EN 61000-4-2(1995)
ESD Immunity Test

[12/I02] IEC 61000-4-3, Ed. 2.0 (2002-03); EN 61000-4-3 (2002)
Radiated Radio-Frequency Electromagnetic Field Immunity Test

[12/I03] IEC 61000-4-4(1995), A1(2000), A2(2001); EN 61000-4-4
Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical Fast Transient/Burst Immunity Test

[12/I04] IEC 61000-4-5, Ed. 1.1 (2001-04); EN 61000-4-5
Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test

[12/I04a] IEC 61000-4-5(1995),A1(2000); EN 61000-4-5(1995),A1(2001)
Surge Immunity Test

[12/I05] IEC 61000-4-6, Ed. 2.0 (2003-05); EN 61000-4-6
Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields

[12/I05a] IEC 61000-4-6 (1996),A1(2000); EN 61000-4-6(1996),A1(2001)
Immunity to Conducted Disturbances, Induced by Radio Frequency Fields

[12/I06] IEC 61000-4-8, Ed. 1.1 (2001); EN 61000-4-8
Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test

[12/I06a] IEC 61000-4-8(1993), A1(2000); EN 61000-4-8(1994), A1(2000)
Power Frequency Magnetic Field Immunity Test

[12/I07] IEC 61000-4-11, Ed. 1.1 (2001-03); EN 61000-4-11
Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests

[12/I07a] IEC 61000-4-11(1994),A1(2001) & EN 61000-4-11(1994),A1(2001)
Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests

[12/I09] EN 50082-1 (1998)
Electromagnetic compatibility - Generic immunity standard - Part 1: Residential, commercial and light industry

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For questions concerning the National Voluntary Laboratory Accreditation Program, contact us:

National Voluntary Laboratory Accreditation Program, Standards Services Division, NIST, 100 Bureau Drive, Stop 2140, Gaithersburg, MD 20899-2140
Phone: (301) 975-4016, Fax: (301) 926-2884, Email: NVLAP@nist.gov

Date created: July 26, 2002
Last Updated: January 8, 2009

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