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Hitachi Information & Communication Engineering, Ltd. EMC Center

NVLAP Lab Code: 200186-0


Address and Contact Information:

456 Sakai, Nakai-machi, Ashigarakami-gun
Kanagawa 259-0157
JAPAN
Contact: Mr. Ryotaro Hoshi
Phone: 81-465-81-5928
Fax: 81-465-81-5938
E-Mail: ryotaro.hoshi.gu@hitachi.com
Send E-Mail to Laboratory: Hitachi Information & Communication Engi
URL: http://www.hitachi-jten.co.jp

NVLAP Accreditation Information

Listed below is the scope of accreditation for this laboratory as of January 8, 2009. For additional information, contact NVLAP at (301) 975-4016.

Send E-Mail to NVLAP at: NVLAP@nist.gov


Electromagnetic Compatibility & Telecommunications

Accreditation Valid From: July 1, 2008 Through: June 30, 2009

  • Emissions Test Methods:

[12/100063c] IEC 61000-6-3 (1996), EN 61000-6-3 (2001), A1 (2004)
Electromagnetic Compatibility (EMC) - Part 6: Generic standards - Section 3: Emission standard for residential, commercial, and light-industrial environments.

[12/610006h] IEC 61000-6-4 (2006-07)
Electromagnetic compatibility (EMC) - Part 6-4: Generic standards - Emission standard for industrial environments

[12/610006k] IEC 61000-6-4 (2006-07)
Electromagnetic compatibility (EMC) - Part 6-4: Generic standards - Emission standard for industrial environments

[12/61000f] EN 61000-6-3 (2001) + A1 (2004)
Electromagnetic compatibility (EMC) - Part 6-3: Generic standard - Emission standard for residential, commericial and light industrial environments

[12/61000g] EN 61000-6-3 (2007)
Electromagnetic compatibility (EMC) - Part 6-3: Generic standard - Emission standard for residential, commericial and light industrial environments

[12/61326d] IEC 61326-1 (2005-12)
Electrical equipment for measurement, control and laboratory use - EMC requirements

[12/CIS11]
IEC/CISPR 11 + A1 (1997), EN 55011 (1998), AS/NZS CISPR 11 (2002), and CNS 13803 (1997): Limits and Methods of Measurement of Electromagnetic Disturbance Characteristics of Industrial, Scientific, and Medical Radio-Frequency Equipment

[12/CIS22] IEC/CISPR 22 (1997) & EN 55022 (1998) + A1(2000)
Limits and methods of measurement of radio disturbance characteristics of information technology equipment

[12/CIS22a] IEC/CISPR 22 (1993) and EN 55022 (1994)
Limits and methods of measurement of radio disturbance characteristics of information technology equipment, Amendment 1 (1995) and Amendment 2 (1996)

[12/CIS22a4] IEC/CISPR 22 (1993) & EN 55022 (1994)+A1(1995), A2(1997)
Limits and methods of measurement of radio disturbance characteristics of information technology equipment

[12/CIS22b] CNS 13438 (1997)
Limits and Methods of Measurement of Radio Interference Characteristics of Information Technology Equipment

[12/CIS22c1] IEC/CISPR 22, Edition 5 (2005) and EN 55022 (1998)
Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement

[12/CIS22c4] EN 55022 (1998) + A1(2000) + A2(2003)
Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement

[12/CIS22g] IEC/CISPR 22, Edition 5 (2005-04) and EN 55022 (2006)
Limits and Methods of Measurement of Radio Disturbance Characteristics of Information Technology Equipment

[12/CIS22j] EN 55022 (2006)
Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement

[12/EM02a]
IEC 61000-3-2, Edition 2.1 (2001-10), EN 61000-3-2 (2000), and AS/NZS 2279.1 (2000): Electromagnetic compatibility (EMC) Part 3-2: Limits - Limits for harmonic current emissions (equipment input current <= 16 A)

[12/EM02aa] EN 61000-3-2 (2000) + A2 (2005)
Electromagnetic compatibility (EMC) - Part 3: Limits - Section 2. Limits for harmonic current emissions (equipment input current <= 16A per phase)

[12/EM02d] IEC 61000-3-2, Edition 2.2 (2004-11)
Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current <= 16 A per phase)

[12/EM02g]
IEC 61000-3-2, Edition 3.0 (2005-11), EN 61000-3-2 (2000), and AS/NZS 2279.1 (2000): Electromagnetic Compatibility (EMC) Part 3-2: Limits - Limits for Harmonic Current Emissions (Equipment Input Current <= 16A)

[12/EM02i] IEC 61000-3-2, Ed. 3.0 (2005-11)
Electromagnetic compatability (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current <=16 A per phase)

[12/EM02j] EN 61000-3-2 (2006)
Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current up to and including 16 A per phase)

[12/EM03] IEC 61000-3-3(1995); EN 61000-3-3(1995); AS/NZS 2279.3(1995)
EMC - Part 3: Limits - Section 3. Limitation of voltage fluctuations and flicker in low-voltage supply systems for equipment with rated current up to 16A

[12/EM03b] IEC 61000-3-3, Edition 1.1(2002-03) & EN 61000-3-3, A1(2001)
EMC - Part 3-3: Limits - Limitations of voltage changes, voltage flucuations and flicker, in public low-voltage supply-systems, for equipment with rated current <=16 A per phase and not subject to conditional connections

[12/EM03g] IEC 61000-3-3, Edition 1.1 (2003) +A2 (2005)
EMC Part 3-3: Limits - Limitations of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current <= 16 A per phase and not subject to conditional connections

[12/EM03h] IEC/EN 61000-3-3 (1995) + A1 (2001) + A2 (2005)
Conducted Emissions, Voltage Flicker

[12/FCC15b] ANSI C63.4 (2003) with FCC Method 47 CFR Part 15, Subpart B
Unintentional Radiators

[12/ICES003] ICES-003 Issue 4 (2004)
Implementation and Interpretation of the Interference-Causing Equipment Standard for Digital Apparatus. (Industry Canada)

[12/T51] AS/NZS CISPR 22 (2002) and AS/NZS 3548 (1997)
Electromagnetic Interference - Limits and Methods of Measurement of Information Technology Equipment

[12/T51a] AS/NZS CISPR 22 (2004)
Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement

[12/VCCIb] Agreement of VCCI V-3 (2006.04)
Agreement of Voluntary Control Council for Interference by Information Technology Equipment - Technical Requirements: V-3/2006.04

[12/VCCIc] Agreement of VCCI V-3 (2007.04)
Agreement of Voluntary Control Council for Interference by Information Technology Equipment - Technical Requirements: V-3/2007.04

  • Immunity Test Methods:

[12/610006g] IEC 61000-6-2, 1st edition (1999-01)
Electromagnetic compatibility (EMC) - Part 6-2: Generic standards - Immunity for industrial environments

[12/610006i] IEC 61000-6-2, Edition 2.0 (2005-01)
Electromagnetic compatibility (EMC) - Part 6-2: Generic standards - Immunity for industrial environments

[12/61326] EN 61326 (1998) and IEC 61326 (1997)
Electrical equipment for measurement, control and laboratory use - EMC requirements

[12/I01] IEC 61000-4-2, Ed. 1.2 (2001) + A1, A2; EN 61000-4-2
Electrostatic Discharge Immunity Test

[12/I01b] IEC 61000-4-2 (2001); EN 61000-4-2 (2001), A2 (2001)
Electrostatic Discharge Immunity Test

[12/I01c] EN 61000-4-2 +A1(1998) +A2(2001)
Electrostatic Discharge Immunity Test

[12/I02] IEC 61000-4-3, Ed. 2.0 (2002-03); EN 61000-4-3 (2002)
Radiated Radio-Frequency Electromagnetic Field Immunity Test

[12/I02b] IEC/EN 61000-4-3, Ed. 2.1 (2002), A1 (2002); EN 61000-4-3
Radiated, radio-frequency, electromagnetic field immunity test

[12/I02e] EN 61000-4-3 (2002) + A1(2002) + IS1(2004)
Radiated, radio-frequency, electromagnetic field immunity test

[12/I02f] EN 61000-4-3 (2002) + A1(2002)
Radiated, radio-frequency, electromagnetic field immunity test

[12/I03] IEC 61000-4-4(1995), A1(2000), A2(2001); EN 61000-4-4
Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical Fast Transient/Burst Immunity Test

[12/I03c] IEC 61000-4-4, Ed. 2.0 (2004-07)
Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test

[12/I04] IEC 61000-4-5, Ed. 1.1 (2001-04); EN 61000-4-5
Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test

[12/I04b] IEC 61000-4-5 (2001), A1(2000); EN 61000-4-5(2001), A1(2000)
Surge Immunity Test

[12/I05] IEC 61000-4-6, Ed. 2.0 (2003-05); EN 61000-4-6
Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields

[12/I05d] IEC 61000-4-6, Ed. 2.1 (2004); EN 61000-4-6
Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields

[12/I05e] EN 61000-4-6 (1996) + A1 (2001)
Immunity to Conducted Disturbances, Induced by Radio Frequency Fields

[12/I06] IEC 61000-4-8, Ed. 1.1 (2001); EN 61000-4-8
Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test

[12/I06b] IEC 61000-4-8 (2001), A1(2000); EN 61000-4-8 (2001),A1(2000)
Power Frequency Magnetic Field Immunity Test

[12/I06c] EN 61000-4-8 (1993) + A1 (2001)
Power Frequency Magnetic Field Immunity Test

[12/I07] IEC 61000-4-11, Ed. 1.1 (2001-03); EN 61000-4-11
Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests

[12/I07c] IEC 61000-4-11, Ed. 2 (2004-03) & EN 61000-4-11
Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests

[12/I07e] EN 61000-4-11 (1994), A1 (2001)
Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests

[12/I07f] EN 61000-4-11 (2004)
Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests

  • RF Exposure Test Methods (SAR & MPE)

[12/60601a] IEC 60601-1-2, Ed1(1993);Ed2(2001-09); JIS T0601-1-2(2002.7)
Medical electrical equipment - Part 1 and Part 1-2: General requirements for safety: Collateral standard: EMC - Requirements and tests

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For questions concerning the National Voluntary Laboratory Accreditation Program, contact us:

National Voluntary Laboratory Accreditation Program, Standards Services Division, NIST, 100 Bureau Drive, Stop 2140, Gaithersburg, MD 20899-2140
Phone: (301) 975-4016, Fax: (301) 926-2884, Email: NVLAP@nist.gov

Date created: July 26, 2002
Last Updated: January 8, 2009

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