Electronics Testing Center, TaiwanNVLAP Lab Code: 200133-0
Address and Contact Information:
No.8, Lane 29, Wenming Road
Leshan Tsuen, Guishan Shiang
Taoyuan County 33383
TAIWAN
Contact: Mr. Win-Po Tsai
Phone: 886-03-3276172
Fax: 886-03-3276188
E-Mail: winpo@etc.org.tw
Send E-Mail to Laboratory: Electronics Testing Center, Taiwan
URL: http://www.etc.org.tw
NVLAP Accreditation Information
Listed below is the scope of accreditation for this laboratory as of January 8, 2009. For additional information, contact NVLAP at (301) 975-4016.
Send E-Mail to NVLAP at: NVLAP@nist.gov
Electromagnetic Compatibility & Telecommunications
Accreditation Valid From: July 1, 2008 Through: June 30, 2009
[12/CIS14] CISPR 14-1 (March 30, 2000)
Limits and Methods of Measurement of Radio interference Characteristics of Household Electrical Appliances, Portable Tools and Similiar Electrical Apparatus - Part 1: Emissions
[12/CIS14a] EN 55014-1 (1993), A1 (1997), A2 (1999)
[12/CIS14b] AS/NZS 1044 (1995)
[12/CIS14c] CNS 13783-1
Electromagnetic Compatibility Requirements for household appliances, electric tools and similar apparatus - Part 1: Emissions
[12/CIS22] IEC/CISPR 22 (1997) & EN 55022 (1998) + A1(2000)
Limits and methods of measurement of radio disturbance characteristics of information technology equipment
[12/CIS22a] IEC/CISPR 22 (1993) and EN 55022 (1994)
Limits and methods of measurement of radio disturbance characteristics of information technology equipment, Amendment 1 (1995) and Amendment 2 (1996)
[12/CIS22b] CNS 13438 (1997)
Limits and Methods of Measurement of Radio Interference Characteristics of Information Technology Equipment
[12/EM02a]
IEC 61000-3-2, Edition 2.1 (2001-10), EN 61000-3-2 (2000), and AS/NZS 2279.1 (2000): Electromagnetic compatibility (EMC) Part 3-2: Limits - Limits for harmonic current emissions (equipment input current <= 16 A)
[12/EM03b] IEC 61000-3-3, Edition 1.1(2002-03) & EN 61000-3-3, A1(2001)
EMC - Part 3-3: Limits - Limitations of voltage changes, voltage flucuations and flicker, in public low-voltage supply-systems, for equipment with rated current <=16 A per phase and not subject to conditional connections
[12/FCC15b] ANSI C63.4 (2003) with FCC Method 47 CFR Part 15, Subpart B
Unintentional Radiators
[12/T51a] AS/NZS CISPR 22 (2004)
Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement
[12/610006a] EN 61000-6-1 (2001)
Electromagnetic compatibility (EMC) - Part 6 - 1: Generic standards - Immunity for residential, commercial and light-industrial environments
[12/610006b] EN 61000-6-2 (2001)
Electromagnetic compatibility (EMC) - Part 6-2: Generic standards - Immunity for industrial environments
[12/CIS14i] EN 55014-2 (1997) and IEC/CISPR 14-2 (1997)
Electromagnetic compatibility - Requirements for household appliances, electric tools and similar apparatus - Part 2. Immunity - Product family standard
[12/I01] IEC 61000-4-2, Ed. 1.2 (2001) + A1, A2; EN 61000-4-2
Electrostatic Discharge Immunity Test
[12/I02] IEC 61000-4-3, Ed. 2.0 (2002-03); EN 61000-4-3 (2002)
Radiated Radio-Frequency Electromagnetic Field Immunity Test
[12/I03] IEC 61000-4-4(1995), A1(2000), A2(2001); EN 61000-4-4
Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical Fast Transient/Burst Immunity Test
[12/I04] IEC 61000-4-5, Ed. 1.1 (2001-04); EN 61000-4-5
Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test
[12/I05] IEC 61000-4-6, Ed. 2.0 (2003-05); EN 61000-4-6
Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
[12/I06] IEC 61000-4-8, Ed. 1.1 (2001); EN 61000-4-8
Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test
[12/I07] IEC 61000-4-11, Ed. 1.1 (2001-03); EN 61000-4-11
Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests
[12/I08] IEC/CISPR 24 (1997), Amd1, A1(2001); EN 55024 (1998)
Information technology equipment - Immunity characteristics - Limits and methods of measurement
- RF Exposure Test Methods (SAR & MPE)
[12/50360] EN 50360 (2001)
Product standard to demonstrate the compliance of mobile phones with the basic restrictions related to human exposure to electromagnetic fields (300 MHz - 3 GHz)
[12/50361] EN 50361 (2001)
Basic standard for the measurement of Specific Absorption Rate related to human exposure to electromagnetic fields from mobile phones (300 MHz - 3 GHz)
[12/62209a] IEC 62209 (2001)
Procedure to measure the Specific Absorption Rate (SAR) for hand-held mobile wireless devices in the frequency range of 300 MHz to 3 GHz
[12/C95] IEEE Std C95.3 (2002)
IEEE Recommended Practice for Measurements and Computations of Radio Frequency Electronmagnetic Fields With Respect to Human Exposure to Such Fields, 100 kHz - 300 GHz
[12/C95b] IEEE C95.1 -1999
IEEE Standard for Safety Levels with Respect to Human Exposure to Radio Frequency Electromagnetic Fields, 3kHz to 300 GHz
[12/OET65c] Supplement C, Edition 01-01 to OET Bulletin 65,Edition 97-01
Additional Information for Evaluating Compliance of Mobile and Portable Devices with FCC Limits for Human Exposure to Radiofrequency Emissions
[12/P1528] IEEE P1528/D1.2 (April 21, 2003)
Recommended Practice for Determining the Peak Spatial-Average Specific Absorption Rate (SAR) in the Human Head from Wireless Communications Devices: Measurement Techniques
[12/ACA2003] ACA Standard 2003
Radiocommunications (Electromagnetic Radiation - Human Exposure) Standard 2003
[12/RSS102] RSS-102, Issue 2 (November 12, 2005)
using IEEE 1528 and/or IEEE C95.3 - Evaluation Procedure for Mobile and Portable Radio Transmiters with respect to Health Canada's Safety Code 6 for Exposure of Humans to Radio Frequency Fields
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For questions concerning the National Voluntary Laboratory Accreditation Program, contact us:
National Voluntary Laboratory Accreditation Program, Standards Services Division, NIST, 100 Bureau Drive, Stop 2140, Gaithersburg, MD 20899-2140
Phone: (301) 975-4016, Fax: (301) 926-2884, Email: NVLAP@nist.gov
Date created: July 26, 2002
Last Updated: January 8, 2009
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