Project Title:
Real-Time Monitor of Particle Depositions on Surfaces
09.09-1791
912438
Real-Time Monitor of Particle Depositions on Surfaces
EOS Technologies, Inc.
606 Wilshire Blvd, Suite 700
Santa Monica
CA
90401
Robert J.
Champetier
213-458-1791
GSFC
NAS5-31946
197
09.09-1791
912438
Abstract:
Real-Time Monitor of Particle Depositions on Surfaces
This project is a passive device that can, on command, sense and measure the amount
of dust and other contamination accumulated on its sensitive surface. The principle
used is to illuminate the surface at grading incidence with light from a diode laser.
The surface consists of a glass plate exposed to the environment of interest. Discrete
particles collected on the plate scatter some of the light, and a portion of the
scattered power is detected by a large area silicon sensor beneath the plate. Additional
diode lasers and features make it possible to measure separately the scatter caused
by dust, molecular films, and erosion and to do this while exposed to the sun. The
initial concept has a smooth, washable, exposed surface with no protrusions and a
device package about the size of a small, thick book. The basic principles have been
demonstrated, and the sensitivity should extend from MIL-STD-1246 levels below 100
to above 700.
There are two types of applications. One is for devices geared for spacecraft use
with emphasis on low weight and ruggedness. The other is for routine use in vacuum
test or production systems with emphasis on convenience, software interface, standardized
design, and low cost.
contamination, detection, particulate, autonomous, sensor, molecular, real-time,
scattering