Structure Determination of Materials Using Electron Microscopy
Description of Invention:
The invention is a method for automating the acquisition of electron microscopic images from a desktop computer interface to provide for data collection by any user from any location. Automated low-dose image acquisition procedures are used to record high-resolution images on either film or CCD, at desired defocus values, and under conditions that satisfy user-specified limits for drift rates of the specimen stage. In a fully automated procedure of the invention, the determination of regions suitable for imaging are carried out automatically using spiral search algorithms. All steps subsequent to insertion of the specimen in the microscope can be carried out on a remote personal computer connected to the microscope computer via the Internet.
Inventors:
Sriram Subramaniam (NCI)
Patent Status:
DHHS Reference No. E-187-2001/0 --
U.S. Provisional Application No. 60/285,819 filed 23 Apr 2001
PCT Application No. PCT/US02/12605 filed 22 Apr 2002, which published as WO 02/086477 on 31 Oct 2002
U.S. Patent Application No. 10/475,821 filed 23 Apr 2001, which issued as U.S. Patent No. 6,987,266 B2 on 17 Jan 2006
For Additional Information Please Contact: Michael Shmilovich J.D.
NIH Office of Technology Transfer
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Phone: (301) 435-5019
Email: shmilovm@mail.nih.gov
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