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# | Title | Year | Author | SuDoc Number | Internet Access | |
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1 | AFM-based microelectrical characterization of grain boundaries in Cu(In,Ga)Se₂ thin films [electronic resource] / | 2005 | Jiang, C.-S. | E 9.17:NREL/CP-520-37338 | http://purl.access.gpo.gov/GPO/LPS68173 |