NIST Materials Reliability Division: Nanoscale Reliability Group

Nanoscale Reliability Group
The Nanoscale Reliability Group develops and demonstrates test methodologies for mechanical reliability of dimensionally-constrained materials, in order to help thin film and nanostructure industries overcome barriers to incorporation of reliable nanomaterials into widespread use. We pursue this mission by integrating tools that reveal structure-property relations at the nano- to microscales: mechanical, electrical, and optical probes, and structural characterization models and methods.		Group Expertise: Crystal defects Electron microscopy and diffraction Mechanical properties, behavior, and testing Microelectronics reliability Micro/nanostructure Modeling from atomistic to continuum scales Nanoparticles Nondestructive evaluation Phonons in low-dimensional systems Physical acoustics and resonant ultrasonics Reliability physics Scanned probe microscopy Thin-film/small-scale mechanics and testing
	Projects: Thin Film & Interconnect Reliability More Details AFM-Based Nanomechanics More Details Nanoscale Strain Metrology More Details Carbon Nanotube Quality contact: Bob Keller, 303-497-7651