Scanning Electron Microscopy

Scanning electron microscopy (SEM) is one of the most frequently used microscopy tools. It allows study of both morphology and composition of biological and physical materials.

High resolution images of morphology (topography) are obtained by scanning an electron beam across a specimen. Part of the versatility of this microscope is the ability to create images over a wide range of magnification with large depth of field. Elemental composition information can be obtained by monitoring the x-rays produced by electron-specimen interaction.

The Zeiss EVO40 scanning electron microscope features operation in a variable pressure mode. This supports study of specimens at a pressure of up to 750 Pascal (~ 5.7 mm Hg ); such specimens do not need conductive coatings and may be moist.