Carlos A. Murillo
CHE Division of Chemistry
MPS Directorate for Mathematical & Physical Sciences
Start Date:
September 1, 2006
Expires:
August 31, 2009 (Estimated)
Awarded Amount to Date:
$905196
Investigator(s):
Joseph Gardella gardella@acsu.buffalo.edu (Principal Investigator)
Frank Bright (Co-Principal Investigator) Hong Luo (Co-Principal Investigator) Alexander Cartwright (Co-Principal Investigator) Mark Swihart (Co-Principal Investigator)
Sponsor:
SUNY at Buffalo
501 Capen Hall
Buffalo, NY 14260 716/645-5000
NSF Program(s):
MAJOR RESEARCH INSTRUMENTATION
Field Application(s):
Program Reference Code(s):
OTHR, 9162, 0000
Program Element Code(s):
1189
ABSTRACT
ABSTRACT
With support from the Major Research Instrumentation (MRI) Acquisition Program, the Department of Chemistry at SUNY at Buffalo will obtain a Imaging Time of Flight Secondary Ion Mass Spectrometer (ToF SIMS) This equipment will enhance research in a number of areas related to materials research a) materials for spintronics science and engineering; b) nanomaterials (including particles, wires, composites); c) polymers and polymeric biomaterials, and d) sensors based on biomaterials.
The Imaging Time of Flight Secondary Mass Spectrometer enables researchers to probe the chemical composition of surfaces and thin films. The technique bombards a surface with ions prepared in an ion source. This dislodges material from the surface that is analyzed by the mass spectrometer. This probes the surface several atom layers deep providing a depth profile. The ion beam will also scan over the material giving a three dimionsional image of the surface. This allows researchers to correlate the chemical composition with the properties of materials and devices at the nano scale level. The interdisciplinary studies that will be carried out using this instrument will have an impact in materials, physics, chemistry, biophysical chemistry, geology and in engineering. The undergraduate and graduate students who will use the equipment for their research projects will be directly introduced to imaging science and nanotechnology.
PUBLICATIONS PRODUCED AS A RESULT OF THIS RESEARCH
(Showing: 1 - 1 of 1).
Goacher, RE; Luo, H; Gardella, JA.
"Formation of high-mass cluster ions from compound semiconductors using time-of-flight secondary ion mass spectrometry with cluster primary ions,"
ANALYTICAL CHEMISTRY,
v.80,
2008,
p. 3261
- 3269.
(Showing: 1 - 1 of 1).
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