Award Abstract #0079416
Acquisition of a Low-Energy Electron Microscope

NSF Org:	DMR Division of Materials Research
Initial Amendment Date:	August 10, 2000
Latest Amendment Date:	October 23, 2000
Award Number:	0079416
Award Instrument:	Standard Grant
Program Manager:	Guebre X. Tessema DMR Division of Materials Research MPS Directorate for Mathematical & Physical Sciences
Start Date:	August 15, 2000
Expires:	December 31, 2001 (Estimated)
Awarded Amount to Date:	$358400
Investigator(s):	Robert Suter suter+@andrew.cmu.edu (Principal Investigator) James Hannon (Former Principal Investigator) R. Feenstra (Co-Principal Investigator) Paul Sides (Co-Principal Investigator) Sara Majetich (Co-Principal Investigator) Stephen Garoff (Co-Principal Investigator)
Sponsor:	Carnegie-Mellon University 5000 Forbes Avenue PITTSBURGH, PA 15213 412/268-8746
NSF Program(s):	MAJOR RESEARCH INSTRUMENTATION
Field Application(s):	0106000 Materials Research
Program Reference Code(s):	AMPP, 9161
Program Element Code(s):	1189

ABSTRACT

0079416

Hanon

Low-Energy Electron Microscopy (LEEM) is used to generate real-time images of surfaces with a lateral resolution of better than 10 nanometer. Surfaces can be imaged at arbitrarily high temperatures, and during growth. Contrast in LEEM arises because of differences in electron reflectivity at the surface, which reflect variations in the structural, chemical and magnetic properties of the surface. This award will help establish a LEEM facility at Carnegie Mellon University for use by an interdisciplinary group of researchers spanning four University departments. Proposed research projects include investigations of phase transitions at surfaces, two-dimensional coarsening and growth, step and phase boundary fluctuations, GaN growth, wetting of organic films, surface magnetism, growth at chiral surfaces, and texture development in thin film growth.

Low-Energy Electron Microscopy (LEEM) is used to generate real-time images of surfaces with a lateral resolution of better than ten nanomters, during growth, and at arbitrarily high temperatures. These unique features allow growth at surfaces to be studied in unprecedented detail. A LEEM facility will be established at Carnegie Mellon University for use by an interdisciplinary group of researchers. LEEM will be applied to a wide range of growth problems, from fundamental investigations of the chemistry and physics of surfaces, to process optimization in the development of new magnetic media.

Please report errors in award information by writing to: awardsearch@nsf.gov.