Award Abstract #0216795
Acquisition of an Atomic Force Microscope for Materials Research and Education

NSF Org:	DMR Division of Materials Research
Initial Amendment Date:	August 14, 2002
Latest Amendment Date:	August 14, 2002
Award Number:	0216795
Award Instrument:	Standard Grant
Program Manager:	Charles E. Bouldin DMR Division of Materials Research MPS Directorate for Mathematical & Physical Sciences
Start Date:	September 1, 2002
Expires:	August 31, 2004 (Estimated)
Awarded Amount to Date:	$153335
Investigator(s):	Paris vonLockette vonlockette@rowan.edu (Principal Investigator) Robert Krchnavek (Co-Principal Investigator) Jeffrey Hettinger (Co-Principal Investigator) Lori Stephans (Co-Principal Investigator) Samuel Lofland (Co-Principal Investigator)
Sponsor:	Rowan University Office of Sponsored Programs Glassboro, NJ 08028 856/256-4057
NSF Program(s):	MPS DMR INSTRUMENTATION, MAJOR RESEARCH INSTRUMENTATION
Field Application(s):	0106000 Materials Research
Program Reference Code(s):	AMPP, 9161, 9141, 1682
Program Element Code(s):	1750, 1189

ABSTRACT

This Major Research Instrumentation RUI grant supports the acquisition of a scanning probe microscope (SPM)) for use in materials research and education. The selected SPM allows for temperature variation using hot and cold stages. For research purposes, the instrument has the needed measurement modes, sensitivity, resolution, and acquisition software to examine composition-structure-property relationships of elastomers and polymers, investigate magnetic domains and twin boundaries in magnetic shape memory alloys, assess surface roughness in thin films, characterize the defect structure in anisotropic superconductors, and provide quantitative feedback regarding dimension and quality of nanoimprinted features. These are topics that impact telecommunications, micromachining, industrial processing, polymer science, and nanotechnology industries. Several courses will benefit from SPM's broad array of scanning measurement capabilities, which include mapping of surface topography, hardness, elastic moduli, contact friction, magnetic domains, and tunneling current.

Polymer science, nanotechnology, and magnetism have been extensively used in the development of new technologies and there is continued demand for fundamental research within these various fields of materials science. Without a doubt, scanning probe microscopy (SPM) has spearheaded many recent advances in these fields. Acquisition of an SPM will permit the faculty to expand current research efforts and continue to foster interdisciplinary collaborations already underway. In addition, the acquisition will allow researchers to initiate new projects with industry and will help prepare students for creative contributions in these areas.

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