Award Abstract #0216033
Acquisition of an Atomic Force Microscope for Material Characterization

NSF Org:	DMR Division of Materials Research
Initial Amendment Date:	August 20, 2002
Latest Amendment Date:	August 20, 2002
Award Number:	0216033
Award Instrument:	Standard Grant
Program Manager:	Charles E. Bouldin DMR Division of Materials Research MPS Directorate for Mathematical & Physical Sciences
Start Date:	September 1, 2002
Expires:	September 30, 2004 (Estimated)
Awarded Amount to Date:	$163094
Investigator(s):	Yaw Yeboah ydy1@psu.edu (Principal Investigator) Mark Mitchell (Co-Principal Investigator) Ishrat Khan (Co-Principal Investigator) Xiu Bu (Co-Principal Investigator) Michael Williams (Co-Principal Investigator)
Sponsor:	Clark Atlanta University 223 James P. Brawley Dr. S.W. Atlanta, GA 30314 404/880-6990
NSF Program(s):	MAJOR RESEARCH INSTRUMENTATION
Field Application(s):	0106000 Materials Research
Program Reference Code(s):	AMPP, 9161, 9141, 1682
Program Element Code(s):	1189

ABSTRACT

This Major Research Instrumentation award supports acquisition of an atomic force microscope (AFM). This instrument will upgrade the research, education and training in surface science and characterization within the biology, chemistry, engineering, and physics departments. Clark Atlanta University (CAU), a historically black college and university, has embarked on an extensive program to increase the total enrollment of science, engineering and mathematics (STEM) students, the annual STEM graduation rate, and the percentage of STEM students that continue to pursue advanced degrees. To accomplish these goals CAU needs research and instructional labs equipped with state of the art instruments, such as the AFM, for cutting edge research and research training in areas as nanoscience and technology. Several faculty members in biology, chemistry, engineering and physics plan to utilize the AFM for research and research training. Research areas of importance that will be studied with the AFM include polymers, composites, microelectronics, photonics, nanotechnology, catalysis, and molecular biology.

The acquisition of the AFM will significantly enhance the faculty and student research activities in surface science and material characterization. The AFM has wide application for the characterization of polymers, biomaterials, thin films and coatings, ceramics and glass, inorganics, optical storage, semiconductors, electronics, metals and insulators. Its use will impact virtually all the STEM students at CAU and other Atlanta University Center institutions. It will be available to an additional 100-250 STEM students from the other Atlanta University Center schools (Morehouse, Spelman and Morris Brown Colleges).

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