![](https://webarchive.library.unt.edu/eot2008/20081106153448im_/http://www.nsf.gov/images/x.gif) News From the Field Fast AFM Probes Measure Multiple Properties of Biomolecules or Materials Simultaneously
![](https://webarchive.library.unt.edu/eot2008/20081106153448im_/http://www.nsf.gov/images/greenlineshort.jpg)
April 16, 2008
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Researchers have developed novel atomic force microscopy probes that can quickly and simultaneously measure biomolecule or material properties, including adhesion, stiffness, elasticity and viscosity, in addition to the standard AFM topography scan.
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Source Georgia Institute of Technology Research News
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