Electron Microscopy Facility
Contact: Eli Sutter, Yimei Zhu
Instruments
- JEOL JEM2100F, a high-resolution Analytical Transmission Electron microscope (ATEM)
Contact: Lihua Zhang (lhzhang@bnl.gov)
This is a versatile workhorse 120-200kV scanning and transmission field-emission electron microscope for high-resolution analytical
structural characterization. It is equipped with a thermal-assisted field-emission gun and two exchangeable objective-lens pole-pieces
(an ultra high-resolution pole-piece with a 0.19nm point-to-point resolution and a ±20° sample tilt, and a high-resolution pole-piece
with a 0.23nm point-to-point resolution and a ±40° sample tilt). The instrument is also equipped with an x-ray energy dispersive
spectrometer for chemical analysis and heating and cooling stages for in-situ experiments and dynamic observations. An electron energy-loss
spectrometer will be added in the near future. It is a user-friendly electron microscope. Users and students can be trained to operate
the instrument.
- Hitachi HD2700C, a dedicated Scanning Transmission Electron Microscope (STEM)
Contact: Yimei Zhu (zhu@bnl.gov) (interim)
This is a state-of-the-art dedicated 200kV cold field emission STEM with an aberration-corrector for the probe-forming lens. It is the
first Hitachi-made aberration corrected electron microscope. The aberration corrector improves the spatial resolution, or probe size, down
to below 0.1nm, while boosts the probe current by a factor of 10. The instrument is optimized for spectroscopy imaging and simultaneous
acquisition of “Z-contrast” images and electron energy-loss spectra. It is equipped with five detectors for various settings using different
convergent angles and collection angles in annular-dark-field imaging. It is also equipped with a high resolution electron energy-loss
spectrometer which can routinely achieve an energy resolution of 0.35eV at zero energy-loss. The instrument is shielded with a metal box to
reduce acoustic noise. A residual gas-analyzer has been installed recently to identify the sources of contaminants on and around the sample.
- FEI Titan 80-300, a dedicated Environmental Transmission Electron microscope (E-TEM)
Contact: Yimei Zhu (zhu@bnl.gov) (interim)
This is an 80-300kV field-emission transmission electron microscope with an objective-lens aberration corrector at spatial resolution of
0.1nm. It has a custom-built environmental-cell for in-situ observation and gas-reaction experiment. The instrument has also scanning
transmission imaging, magnetic imaging, and chemical analysis capabilities. It has a Lorentz lens and a bi-prism for imaging electrostatic
and magnetic potential or field in materials. It is also equipped with an energy dispersive x-ray spectrometer and an electron energy-loss
spectrometer. It is the most versatile instrument among the three in the facility. The maximum gas pressure for the e-cell is about 20mbar.
Last Modified: May 6, 2008
Please forward all questions about this site to:
Stephen Giordano.
|
