Beamline X13A
General Information
Source Type Insertion Device Status Operational General User Beamtime 50% Energy Range Category Soft X-Ray (0.1-1 keV) Energy Range .2-1.6 keV
Beamline Type Facility Beamline Technique(s) X-ray scattering, magnetic X-ray scattering, resonant Magnetic circular dichroism
Institution(s) NSLS
Research Types Linear soft x-rays and fast switching (22Hz) circularly polarized soft x-rays
Contact Information
Spokesperson ![The person from each beamline who acts as a contact point between the beamline management and NSLS administration. Contact for questions about the beamline scientific program, experimental capabilities, and beamline management.](https://webarchive.library.unt.edu/eot2008/20080916100427im_/http://www.nsls.bnl.gov/images/icons/definition_sm.gif)
Cecilia Sanchez Hanke, Brookhaven National Laboratory, hanke@bnl.gov, 344-5699
Local Contact ![The beamline staff member who is typically responsible for overseeing the daily operation and maintenance of the beamline. Contact for questions about beamline instrumentation, experimental details, and training.](https://webarchive.library.unt.edu/eot2008/20080916100427im_/http://www.nsls.bnl.gov/images/icons/definition_sm.gif)
Cecilia Sanchez Hanke, Brookhaven National Laboratory, hanke@bnl.gov, 344-5699 Elio Vescovo, Brookhaven National Laboratory, vescovo@bnl.gov, 344-7399
Beamtime Scheduler ![The beamline staff member responsible for coordination of beamline schedule every trimester. Contact for questions about beamtime scheduling.](https://webarchive.library.unt.edu/eot2008/20080916100427im_/http://www.nsls.bnl.gov/images/icons/definition_sm.gif)
Cecilia Sanchez Hanke, Brookhaven National Laboratory, hanke@bnl.gov, 344-5699
Beamline Phone
631-344-5613
Instrumentation
Beamline Characteristics
Energy Range |
Mono Crystal or Grating |
Resolution (ΔE/E) |
Flux |
Spot Size (mm) |
Total Angular Acceptance (mrad) |
0.2 – 1.6 keV |
spherical gratings: 800 and 1600 grooves/mm |
2 x 10-4 (@ 400 eV) |
|
2H x 1V |
|
Source Type 22 Hz polarization switching Elliptical Polarized Wiggler (EPW) Optical System The X13A optics consist of an integrally-water-cooled deflection/focusing mirror (M0) followed by a horizontally-dispersing soft x-ray spherical grating monochromator (SGM) and a 22-Hz polarization selection chopper. The M0 mirror, installed and commissioned in mid-2004, provides more stability and higher flux (gain of one order of magnitude) than did the old mirror. The SGM features two diffraction gratings (800 and 1600 grooves/mm), a water-cooled entrance slit, and a movable exit slit. The 22-Hz chopper is synchronized to the switching frequency of the EPW and provides both 22 Hz and 44 Hz signals to the phase-sensitive detector electronics. Experimental Apparatus The sample chamber houses a two-circle vacuum-compatible diffractometer that provides the capability to perform scattering measurements in the horizontal plane. An electromagnet and a Janis He-tran cryostat provide the capability to apply magnetic fields on the sample up to ± 0.1Tesla parallel to the sample surface and cool the sample down to 30 K, respectively. Standard soft x-ray detectors are available: a soft x-ray photodiode and total electron yield via the sample current. Computer System Hardware & Software Unix computer connected to EPICS via RTEMS in a standard VME crate. GPIB interface via a PCI card in the control PC, to control the lock-in amplifiers, the magnet field, and the sample temperature. SPEC is used for beamline control and data acquisition. Mathematica is available for data analysis.
Links
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