[N01] Preparing
Your Laboratory for 17025 Accreditation
Barbara
Belzer, Thomas Hettenhouser, and Sherrie Wentzel, NVLAP
Achieving
laboratory accreditation can seemingly take a long time and is a lot of
work. What should a laboratory do to prepare for an initial accreditation?
Step through the application process. What happens to your quality
manual once it's submitted? What should you expect during an on-site
assessment? What should you expect from your assessment team?
What happens when your lab has nonconformities? How do you respond
to the accreditation body? Will you ever have a perfect assessment?
Walk through the process as approached by NVLAP. We will share with
you tips and hints and discuss common tripping points.
How
certain are you about your uncertainties? What is metrological traceability
and why should anybody care? Work through some practical examples
with us. How can proficiency testing impact your accreditation?
Learn about the requirement for proficiency testing, how it is used to
validate claims of measurement uncertainty, and how it is approached by
NVLAP.
What
about Accrediting Bodies, do they have to answer to a high authority?
What are the benefits of being accredited by a recognized body? Reduced
costs and market acceptance jump to the forefront. Learn the ins
and outs of the Mutual Recognition Arrangements and how they can benefit
your business.
This
two-day tutorial will be interactive with a combination format consisting
of presentations, working through examples, group exercises, and with ample
opportunity for questions and answers.
For
further information:
Barbara
Belzer (301) 975-2248, barbara.belzer@nist.gov
Thomas
Hettenhouser (301) 975-2013, thomas.hettenhouser@nist.gov
Sherrie
Wentzel (301) 975-3994, sherrie.wentzel@nist.gov
[N02] Hands-on
Workshop on Estimating and Reporting Measurement Uncertainty
Will
Guthrie and Hung-kung Liu, NIST Statistical Engineering Division
This
workshop on uncertainty estimation will describe the statistical framework
and methods needed to develop uncertainty statements based on the “ISO
Guide to the Expression of Uncertainty in Measurement”. Methods for
uncertainty estimation will be illustrated with many practical examples
form different metrological areas. The workshop will also include
hands-on examples to be analyzed by the participants. The hands-on
examples will be done using propagation of uncertainty formulas, the Kragten
spreadsheet, an easy-to-use computational tool for propagation of uncertainty,
and other open-source uncertainty calculators.
Pre-requisites:
1.
Laptop computers with Microsoft Excel are required to do the hands-on exercises.
Participants who have access to a laptop should bring one. Some extra
laptops are also available for those who cannot bring their own.
Please contact the instructors in advance if you will need a laptop.
2.
Participants should have some experience with the use of Microsoft Excel
for the analysis of data. As part of the hands-on exercises, it will
be necessary for participants to be able to copy and paste spreadsheet
contents and to enter simple formulas. Advanced knowledge of Excel
is not required.
For
further information:
Will
Guthrie (301) 975-2854, willguthrie@nist.gov
[N03] Time
and Frequency: Measurements and Applications
Michael
Lombardi and Andrew Novick, NIST Time and Frequency Division
Bob
Graham, Sandia National Laboratories
This
two-day seminar serves as an ideal introduction to the field of time and
frequency metrology. It is intended for anyone who makes time and
frequency related measurements in a metrology or engineering setting, or
is involved in any application involving precise frequency and time information.
The
primary focus of the seminar is on reference standards and the measurement
methods and techniques used for frequency and time calibrations, for devices
ranging from stopwatches to atomic oscillators. It covers both quartz
and atomic frequency standards, and the use of Global Positioning System
(GPS) disciplined oscillators. It explains how to measure frequency
offset and stability, and how to establish traceability for frequency and
time interval measurements through NIST to the International System of
Units (SI). Actual measurements will be demonstrated in the classroom,
and the students can participate in the hands-on demonstrations.
Topics
will include:
* Time
and Frequency Terminology
*
Fundamentals of Time and Frequency Measurements and Calibrations
*
Stop Watch and Timer Calibrations
*
Time Synchronization
*
Frequency Standards (Quartz, Rubidium, and Cesium Oscillators)
*
Global Positioning System (GPS) Disciplined Oscillators
*
Traceability and Legal Metrology
*
Time Domain Stability and Noise Analysis
*
Measurement Uncertainty Analysis
*
Time and Frequency Related Instrumentation
For
further information:
Michael
Lombardi (303) 497-3212, lombardi@.nist.gov
[N04] Basic
Mass Short Course
Val
Miller, Jose Torres, NIST Weights and Measures Division
This
seminar will be a short course to include highlights from the NIST “Basic
Mass for Industry” seminar which is a 1-week,"hands-on" seminar.
The seminar will focus on the understanding and application of the procedures,
the equations, and calculations involved, including repeatability, statistical
and error analysis, care and handling of mass standards, operation of the
laboratory equipment, use of measurement assurance methods and review of
publications, specifications, and tolerances relevant to the measurements
likely to be performed by the metrologist at a Basic level.
As
a result of the seminar, a metrologist should be able to obtain additional
hands on experience in their own laboratory performing Basic measurements
to gain the proficiency needed to perform Basic calibrations of mass standards
(without air buoyancy corrections). Air buoyancy concepts are introduced
but not covered extensively due to the lack of time and complexity of the
subject.
Completion
of the Basic Mass Metrology CD-Rom (NISTIR 1001) and some laboratory experience
are recommended for students attending this seminar. NIST IR6969
is used as the main text. The CD is available by request from owm@nist.gov
and the calibration procedures are available at: http://www.nist.gov/labmetrology.
Computers are NOT allowed for calculations in this seminar. Users
must bring a scientific calculator and be familiar with its use.
For
further information:
Val
Miller (301) 975-3602, val.miller@nist.gov
[N05] Software
Verification & Validation:
Developing
Advanced Scientific Engineering Spreadsheet Applications
Graeme
Parkin and Robin Barker, National Physical Laboratory (UK), by invitation
from NIST
Spreadsheets
are widely used by scientists and engineers because of their ease of use
for the analysis and presentation of results. However, spreadsheet
errors are both common and often very difficult to detect. In addition,
there are the inherent errors built into the most widely used spreadsheets,
which can result in strange computation errors. NPL's experience
over many years is that the most effective antidote is to treat the development
of spreadsheet applications as a software development project.
The
course will consist of presentations and hands-on exercises using Microsoft
Excel and will cover a number of key topics, including (but not limited
to):
•
Basic approach to spreadsheet development
•
Use of formulas
•
Spreadsheet application documentation
•
Spreadsheet user interactions
•
Simple validation
•
Spreadsheet integrity
•
Spreadsheet testing
•
Spreadsheet unit testing
•
Delivery of spreadsheet applications
•
Overview of quality assurance issues
Attendees
will receive a complete set of course notes, a copy of the Software Support
for Metrology, Best Practice Guide No 7, Development and Testing of Spreadsheet
Applications, December 2006, model answers to all the exercises and a recommended
book list.
Lecturing
Team:
The
course will be given by Graeme Parkin and Robin Barker. Graeme has
worked on software validation for some years. He has used formal
methods for both specification and proof of properties of systems.
He also has practical experience of managing and developing software developments.
Robin has also worked on software validation for some years and used formal
methods for both specification and testing of systems. Both Graeme
and Robin are co-authors of the Best Practice Guide on which the course
is based.
Pre-requisites:
1.
Laptop computers with Microsoft Excel are required to do the hands-on exercises.
Participants who have access to a laptop should bring one.
2.
The course is suited to attendees with a science or engineering background,
knowledge of Excel and some experience of programming.
For
further information:
Graeme
Parkin (tel) 020 8943 7104, (fax) 020 8977 7091, graeme.parkin@npl.co.uk
[N06] Pressure
and Vacuum Measurement
Jay
H. Hendricks, NIST Pressure and Vacuum Group
Michael
Holleron, Navy Primary Standards Laboratory
Making
good pressure measurements from ultra-high vacuum to atmospheric pressure
requires the correct use of many kinds of gauges and proper use of vacuum
technology. Among the most widely used gauges are ionization gauges,
spinning rotor gauges, thermal conductivity gauges, capacitance diaphragm
gauges, quartz bourdon tube gauges, and resonant silicon gauges.
However, the incorrect use of any of these gauges can result in bad measurements
that cost time and money. New this year will be a section devoted
to basic vacuum system pumping and design that are essential to making
good pressure measurements in vacuum systems.
This
two-day course will cover the fundamentals of pressure measurements from
10-8 Pa to 10+5 Pa (10-10 torr to 10+3 torr), focusing on the selection
and proper use of appropriate gauging technology for a given application.
A survey of calibration techniques will be presented along with recommendations
for obtaining best performance. Part of the class time will
be devoted to set-up of a simple vacuum calibration system. This
will enable live demonstration of some of the gauges discussed in the course,
and give students an opportunity to participate in the vacuum system set-up
and disassembly. Attendees are invited to share their own pressure
measurement and or vacuum system design problems for in-class discussion.
For
further information:
Jay
Hendricks (301) 075-4836, jay.hendricks@nist.gov |